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Microstructure of Ca3Co4O9 Single Crystals and Thin Films

Published online by Cambridge University Press:  01 February 2011

Yufeng Hu ,
Eli Sutter ,
Weidong Si  and
Qiang Li
Yufeng Hu
Affiliation:
yhu@bnl.gov, Brookhaven National Laboratory, Building 480, Upton, New York, 11973, United States, 631-344-5129, 631-344-4071
Eli Sutter
Affiliation:
esutter@bnl.gov
Weidong Si
Affiliation:
wds@bnl.gov
Qiang Li
Affiliation:
liqiang@bnl.gov
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Abstract

We present a comparative study of the microstructure of Ca3Co4O9 single crystals and c-axis oriented Ca3Co4O9 thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.

Keywords

microstructurethermoelectricityfilm
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 886: Symposium F – Materials and Technologies fore Direct Thermal-to-Electric Energy Conversion , 2005 , 0886-F01-08
Copyright
Copyright © Materials Research Society 2006

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References

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