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Multi-Frequency Atomic Force Microscopy Combining Amplitude- and Frequency-Modulation Techniques

Published online by Cambridge University Press:  30 March 2012

Santiago D. Solares  and
Gaurav Chawla
Santiago D. Solares
Affiliation:
Department of Mechanical Engineering, University of Maryland, 2181 Glenn L. Martin Hall, College Park, MD 20742, U.S.A.
Gaurav Chawla
Affiliation:
Department of Mechanical Engineering, University of Maryland, 2181 Glenn L. Martin Hall, College Park, MD 20742, U.S.A.
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Abstract

Multi-frequency atomic force microscopy (AFM) offers additional response signals in comparison to traditional dynamic AFM. Furthermore, depending on the mode of operation used, the higher eigenmode responses are generally not directly influenced by the topographical acquisition control loops, such that they can explore a fuller range of tip-sample interactions. In this work we describe the implementation of multi-frequency imaging schemes that enable the acquisition of topographical, phase and frequency shift contrast in tapping-mode operation. This type of characterization can be especially useful for soft, highly dissipative samples, such as polymers, for which the various response channels can exhibit significantly different response, thus providing complementary information. We discuss typical results obtained as well as important challenges that need to be addressed in order to develop a fully quantitative technique.

Keywords

scanning probe microscopy (SPM)microstructureviscoelasticity
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1422: Symposium QQ – Functional Imaging of Materials–Advances in Multifrequency and Multispectral , 2012 , mrsf11-1422-qq03-07
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Patil, S., Martinez, N.F., Lozano, J.R. and Garcia, R., “Force microscopy imaging of individual protein molecules with sub-pico Newton force sensitivity,” J. Mol. Recognition 20, 516 (2007).Google Scholar
2. Rodriguez, T. and Garcia, R., “Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever,” Appl. Phys. Lett. 84, 449 (2004).Google Scholar
3. Proksch, R., “Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy,” Appl. Phys. Lett. 89, 113121 (2004).Google Scholar
4. Lozano, J.R., and Garcia, R., “Theory of multifrequency atomic force microscopy,” Phys. Rev. Lett. 100, 076102 (2008).Google Scholar
5. Martinez, N.F., Lozano, J.R., Herruzo, E.T., Garcia, F., Richter, R.C., Sulzbach, T. and Garcia, R., “Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids,” Nanotechnology 19, 384011 (2008).Google Scholar
6. Garcia, R. and Perez, R., “Dynamic atomic force microscopy methods,” Surf. Sci. Reports 47, 197 (2002).Google Scholar
7. Kawai, S., Glatzel, T., Koch, S., Such, B., Baratoff, A. and Meyer, E., “Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy” Phys. Rev. Lett. 103, 220801 (2009).Google Scholar
8. Naitoh, Y., Ma, Z., Li, Y., Kageshima, M. and Sugawara, Y., “ Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy,” J. Vac. Sci. Technol. B 28, 1210 (2010).Google Scholar
9. Rodriguez, B., Callahan, C., Kalinin, S.V. and Proksch, R., “Dual-frequency resonance-tracking atomic force microscopy,” Nanotechnology 18, 475504 (2007).Google Scholar
10. Platz, D., Tholen, E.A., Pesen, D. and Haviland, D.B., “Intermodulation atomic force microscopy,” Appl. Phys. Lett. 92, 153106 (2008).Google Scholar
11. Jesse, S., Kalinin, S.V., Proksch, R., Baddorf, A.P. and Rodriguez, B.J., “The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale,” Nanotechnology 18, 435503 (2007).Google Scholar
12. Sahin, O., Magonov, S., Su, C.M., Quate, C.F. and Solgaard, O., “An atomic force microscope tip designed to measure time-varying nanomechanical forces,” Nature Nanotech. 2, 507 (2007).Google Scholar
13. Stark, M., Stark, R.W., Heckl, W.M. and Guckenberger, R., “Inverting dynamic force microscopy: from signals to time-resolved interaction forces,” Proc. Natl. Acad. Sci. USA 99, 8473 (2002).Google Scholar
14. Solares, S.D. and Hölscher, H., “Numerical analysis of dynamic force spectroscopy using the torsional harmonic cantilever,” Nanotechnology 21, 075702 (2010).Google Scholar
15. Li, Y.J., Takahashi, K., Kobayashi, N., Naitoh, Y., Kageshima, M. and Sugawara, Y., “Multifrequency high-speed phase-modulation atomic force microscopy in liquids,” Ultramicroscopy 110, 582 (2010).Google Scholar
16. Chawla, G. and Solares, S.D., “Single-cantilever dual-frequency-modulation atomic force microscopy,” Meas. Sci. & Technol. 20, 015501 (2009).Google Scholar
17. Solares, S.D. and Chawla, G., “Dual frequency modulation with two cantilevers in series: a possible means to rapidly acquire tip–sample interaction force curves with dynamic AFM ” Meas. Sci. & Technol. 19, 055502 (2008).Google Scholar
18. Solares, S.D. and Chawla, G., “Triple-frequency intermittent contact atomic force microscopy characterization: Simultaneous topographical, phase and frequency shift contrast in ambient air,” J. Appl. Phys. 108, 054901 (2010).Google Scholar
19. Solares, S.D. and Chawla, G., “Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy,” Meas. Sci. & Technol. 21, 125502 (2010).Google Scholar
20. Chawla, G. and Solares, S.D., “Mapping of conservative and dissipative interactions in bimodal atomic force microscopy using open-loop and phase-locked-loop control of the higher eigenmode,” Appl. Phys. Lett. 99, 074103 (2011).Google Scholar