Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-17T21:15:50.672Z Has data issue: false hasContentIssue false

The Organometallic Chemical Vapor Deposition of Transition Metal Carbides: the Use of Homoleptic Alkyls

Published online by Cambridge University Press:  22 February 2011

Matthew D. Healy
Affiliation:
CST-3, MS-C346, Los Alamos National Laboratory, Los Alamos, NM, 87545
David C. Smith
Affiliation:
CST-3, MS-C346, Los Alamos National Laboratory, Los Alamos, NM, 87545
Rodrigo R. Rubiano
Affiliation:
Dept. of Nuclear Eng., Massachusetts Institute of Technology, Cambridge, MA, 02139
Robert W. Springer
Affiliation:
MST-7, MS-E549, Los Alamos National Laboratory, Los Alamos, NM, 87545
John E. Parmeter
Affiliation:
Dept. 1126, Sandia National Laboratories, Albuquerque, NM, 87105
Get access

Abstract

The organometallic chemical vapor deposition (OMCVD) of transition metal carbides (M = Ti, Zr, Hf, and Cr) from tetraneopentyl-metal precursors has been carried out. Metal carbides can be deposited on Si, A120 3, and stainless steel substrates from M[CH 2C(CH3)3]4 at temperatures in the range of 300 to 750 "C and pressures from 10-2 to 10-4 Torr. Thin films have also been grown using a carrier gas (Ar, H2). The effects of variation of the metal center, deposition conditions, and reactor design on the resulting material have been examined by SEM, XPS, XRD, ERD and AES. Hydrocarbon fragments generated in the deposition chamber have been studied by in-situ mass spectrometry. Complimentary studies examining the UHV surface decomposition of Zr[CH2C(CH3)3]4 have allowed for a better understanding of the mechanism leading to film growth.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. a) Zinn, A., Niemer, B., and Kaesz, H.D., Adv. Mater. 4, 375 (1992). b) F. Maury, Adv. Mater. 3, 542 (1991).Google Scholar
2. Mond, L., Langer, C., and Quincke, F., J. Chem. Soc. 57, 749 (1890).Google Scholar
3. Manasevit, H.M., J. Crystal Growth 55, 1 (1981).Google Scholar
4. Girolami, G.S., Jensen, J.A., Pollina, D.M., Williams, W.S., Kaloyeros, A.E., and Alloca, C.M., J. Am. Chem. Soc. 109, 1579 (1987).Google Scholar
5. Hollabaugh, C.M., Wahman, L.A., Reiswig, R.D., White, R.W., and Wagner, P., Nuclear Technology 35, 527 (1977).Google Scholar
6. Smith, D.C., Rubiano, R.R., Healy, M.D., and Springer, R.W. in Chemical Perspectives of Microelectronic Materials III, edited by Abernathy, C.R., Bates, C.W. Jr., Bohling, D.A., and Hobson, W.S. (Mater. Res. Soc. Proc. 282, Pittsburgh, PA, 1993) pp. 643649.Google Scholar
7. Healy, M.D., Smith, D.C., Rubiano, R.R., Elliott, N.E., and Springer, R.W., Chem. Mater., submitted.Google Scholar
8. Rutherford, N.M., Larsen, C.E., and Jackson, R.L. in Chemical Perspectives of Microelectronic Materials, edited by Gross, M.E., Jasinski, J.M., and Yates, J.T. Jr., (Mater. Res. Soc. Proc. 131, Pittsburgh, PA, 1989) pp.439445.Google Scholar
9. Muary, F. and Ossola, F., Thin Solid Films 207, 82 (1992).Google Scholar
10. a) Parmeter, J.E., Smith, D.C., and Healy, M.D., J. Vac. Sci. Technol., submitted. b) J.E. Parmeter, J. Phys. Chem. 97, 11530 (1993).Google Scholar
11. Davidson, P.J., Lappert, M.F., and Pearce, R., Chem. Rev. 76, 219 (1976).Google Scholar
12. Groshens, T.J., Lowe-Ma, C.K., Scher, R.C., and Dalbey, R.Z. in Chemical Perspectives of Microelectronic Materials III, edited by Abernathy, C.R., Bates, C.W. Jr., Bohling, D.A., and Hobson, W.S. (Mater. Res. Soc. Proc. 282, Pittsburgh, PA, 1993) pp. 299304.Google Scholar
13. Cr7C3 is a known phase. Reference is made to the JCPDS file number 361482.Google Scholar
14. Muary, F., Ossola, F., and Schuster, F., Surf. Coat. Technol. 54/55, 204 (1992).Google Scholar
15. Davidson, P.J., Lappert, M.F., and Pearce, R., J. Organomet. Chem. 57, 269 (1973).Google Scholar
16. Our observed neopentane/isobutylene ratios under CVD conditions are 2.03 (Ti); 0.99 (Zr); 0.69 (Hf); 0.76 (Cr). These values have been corrected for instrument sensitivity using isobutylene and neopentane. We believe that these values are correct to within 10%. Full details will be published in due course.Google Scholar
17. Because of the carbon isotopic ratio, the m/e = 15 feature is accompanied by a 1% relative intensity m/e = 16 feature. When methane is present, m/e = 16 is significantly more intense.Google Scholar
18. Neopentane does not have an observable C5 fragment under our conditions.Google Scholar