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Particle Size Measurement in Optical Waveguide Manufacturing Torches Using Dynamic Light Scattering

Published online by Cambridge University Press:  22 February 2011

J. R. Bautista ,
Eugene Potkay  and
Daria L. Scatton
J. R. Bautista
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave, Murray Hill, NJ 07974
Eugene Potkay
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave, Murray Hill, NJ 07974
Daria L. Scatton
Affiliation:
Univ. of Illinois, Dept. of Ceramic Engineering, Champaign, IL.
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Abstract

The characterization of silica “sooting” torches used in optical waveguide manufacture by external flame-hydrolysis deposition processes such as Outside Vapor Deposition (OVD) and Vapor-phase Axial Deposition (VAD) prflents a formid.ble high temperature environment at > 2000°C in the presence of > 1012 particles/cm3 of silica. This paper describes the first application of Dynamic Light Scattering (DLS) to probe particle sizes in an actual lightguide burner following the “triple-flame” VAD design. DLS, also termed Photon Correlation Spectroscopy (PCS) or Diffusion Broadening Spectroscopy (DBS), was previously identified as a viable diagnostic tool for in-situ particle measurements in silica-sooting flames by W. L. Flower [1] and through an earlier collaboration between AT&T and the Sandia Combustion Research Facility. In applying DLS, however, our experience with the VAD torch reveals that a specialized experimental method will undoubtedly be required to deal with the inevitable presence of low frequency system instabilities in industrial systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 117: Symposium C – Process Diagnostics: Materials, Combustion, Fusion , 1988 , 151
Copyright
Copyright © Materials Research Society 1988

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