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Pulsed-Laser Deposition of Biaxially Textured YSZ/CeO2 Films on Electrodeposited Ir/Ni-W Tapes for YBCO Superconductors

Published online by Cambridge University Press:  01 February 2011

Tapas Chaudhuri
Affiliation:
National Renewable Energy Laboratory, Superconductivity Group, 1617 Cole Blvd., Golden, CO 80401, USA
Priscila Spagnol
Affiliation:
National Renewable Energy Laboratory, Superconductivity Group, 1617 Cole Blvd., Golden, CO 80401, USA
Raghu Bhattacharya
Affiliation:
National Renewable Energy Laboratory, Superconductivity Group, 1617 Cole Blvd., Golden, CO 80401, USA
Sovannary Phok
Affiliation:
National Renewable Energy Laboratory, Superconductivity Group, 1617 Cole Blvd., Golden, CO 80401, USA
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Abstract

Iridium film is a potential candidate as a buffer layer for yttrium barium copper oxide (YBCO) coated conductors. Pulsed laser deposition (PLD) of biaxially textured CeO2/yttrium stabilized zirconium oxide (YSZ) layers on electrodeposited Ir/Ni-W is reported. Biaxial texturing is obtained by deposition of a YSZ seed layer at 800°C in 10-6 Torr vacuum. X-ray diffraction (XRD) studies of Θ-2Θ and pole figure confirmed in-plane out-of-plane biaxial texturing with Δφ = 6.5° and Δω = 8°. Atomic force microscopy (AFM) revealed a surface with roughness of about 3 nm.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

1 Goyal, A., Paranthaman, M.P., and Scoop, U., MRS Bull. 29, 552 (2004)Google Scholar
2 Norton, D. P., Mater. Sci. Engg. R 43, 134 (2004)Google Scholar
3 Bhattacharya, R. N., Chen, J., Spagnol, P., and Chaudhuri, T., Electrochem. Solid State Lett. 7 D22 (2004)Google Scholar
4 Aytug, T., Parntham, M., Zhai, H.Y., Gapud, A.A., Leonard, K.J., Martin, P.M., Goyal, A., Thompson, J.R., and Christen, D.K., Appl. Phys. Lett. 85, 2887 (2004).Google Scholar
5 Spagnol, P., Chaudhuri, T., Bhattacharya, R. and Phok, S., (this conference) (2005)Google Scholar
6 Chen, J., Spagnol, P., Bhattacharya, R.N., and Ren, Z., J. Phys. D: Appl. Phys. 37, 2623 (2004).Google Scholar