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Scanning Auger Microscopy Characterization of Magnetic Hard Disc

Published online by Cambridge University Press:  10 February 2011

D. W. Harris
Affiliation:
Charles Evans & Associates, Sunnyvale CA 94086
D. L. Neiman
Affiliation:
Hewlett Packard, Corvallis, OR 97330
J. Huang
Affiliation:
Charles Evans & Associates, Sunnyvale CA 94086
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Abstract

Applications of Zalar rotation and field emission Auger (FE-AES) analysis in various magnetic hard disc problems will be presented. These applications include thin layer structure characterization, low concentration contaminant (0.1–0.5 atomic percent) detection at deeper interfaces (greater than 1000Å), and small particle (-∼1000Å) contaminant identification.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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