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Size Effect Study of the L10 Phase Transformation in FePt Nanoparticles

Published online by Cambridge University Press:  01 February 2011

Yi Ding  and
Sara A. Majetich
Yi Ding
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213-3890, U.S.A.
Sara A. Majetich
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213-3890, U.S.A.
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Abstract

The relation between particle size and anisotropy in the fcc to L10 phase transformation in FePt nanoparticles is described. After annealing to partially sinter the particles, the volume distribution was found by transmission electron microscopy, and related to the magnetic switching field distribution. With the assumption that larger particles have higher switching fields, we find a consistent size threshold, d*, of about 12 nm for high anisotropy, independent of the annealing conditions. Our analysis shows that the phase transformation is limited by the lack of nucleation sites in small particles rather than by the chemical inhomogeneity.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 877: Symposium S – Magnetic Nanoparticles and Nanowires , 2005 , S4.5
Copyright
Copyright © Materials Research Society 2005

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References

1. Sun, S., Murray, C. B., Weller, D., Folks, L., and Moser, A., Science 287, 1989 (2000).Google Scholar
2. Dai, Z. R., Sun, S., and Wang, Z. L., Nano Lett. 1, 443 (2001).Google Scholar
3. Harrell, J. W., Wang, S., Nikles, D. E., Chen, M., Appl. Phys. Lett. 79, 4393 (2001).Google Scholar
4. Klemmer, T. J., Shukla, N., Liu, C., Wu, X. W., Svedberg, E. B., Mryasov, O., Chantrell, R. W., Weller, D., Tanase, M., Laughlin, D. E., Appl. Phys. Lett. 81, 2220 (2002).Google Scholar
5. Ding, Y., Farrell, D., Yamamuro, S., and Majetich, S. A., J. Appl. Phys. 93, 7411 (2003).Google Scholar
6. Jeyadevan, B., Hobo, A., Urakawa, K., Chinnasamy, C. N., Shinoda, K., and Tohji, K., J. Appl. Phys. 93, 7574 (2003).Google Scholar
7. Takahashi, Y. K., Ohkubo, T., Ohnuma, M., and Hono, K., J. Appl. Phys. 93, 7580 (2003).Google Scholar
8. Okamoto, S., Kitakami, O., Kikuchi, N., Miyazaki, T., Shimada, Y., and Takahashi, Y. K., Phys. Rev. B 67, 094422 (2003).Google Scholar
9. Mao, C., Solis, D. J., Reiss, B. D., Kottmann, S. T., Sweeney, R. Y., Georgiu, G., Iverson, B., and Belcher, A. M., Science 303, 213 (2004).Google Scholar
10. Sakuma, H., Taniyama, T., Kitamoto, Y., Yamazaki, Y., Nishio, H., and Yamamoto, H., J. Appl. Phys. 95, 7261 (2004).Google Scholar
11. Sun, X., Kang, S., Harrell, J. W., Nikles, D. E., Dai, Z. R., Li, J., and Wang, Z. L., J. Appl. Phys. 93, 7337 (2003).Google Scholar
12. Saita, S. and Maenosono, S, J. Phys.: Condens. Matter 16, 6385 (2004).Google Scholar
13. Ding, Y., Majetich, S. A., Kim, J., Barmak, K., Rollins, H., and Sides, P., J. Magn. Magn. Mater. 284, 336 (2004).Google Scholar
14. Yu, A. C. C., Mizuno, M., Sasaki, Y., and Kondo, H., Appl. Phys. Lett. 85, 6242 (2004).Google Scholar
15. Chepulski, R. V., Velev, J., and Butler, W. H., “Monte Carlo simulation of equilibrium L10 ordering in FePt nanoparticles”, arXiv:cond-mat/0410590v1 22 Oct 2004.Google Scholar
16.NIH Image is a public domain image processing and analysis program for the Macintosh. It was developed at the Research Services Branch (RSB) of the National Institute of Mental Health (NIMH), part of the National Institutes of Health (NIH).Google Scholar
17. Luborsky, F. E., J. Appl. Phys. 32, 171S (1961).Google Scholar
18. Sharrock, M. P., IEEE Trans. Mag. 26, 193 (1990).Google Scholar
19. Okamoto, H., “Desk handbook: phase diagrams for binary alloys”, (ASM International, Materials Park, OH, 2000) pp. 371.Google Scholar
20. Scott, J. H. and Majetich, S. A., Mat. Res. Soc. Symp. Proc. 403, 731 (1996).Google Scholar
21. Barmak, K., Kim, J., Ristau, R. A., and Lewis, L. H., IEEE Trans. Mag. 38, 2799 (2002).Google Scholar
22. Ristau, R. A., Barmak, K., Coffey, K. R., and Howard, J. K., J. Mater. Res. 14, 3263 (1999).Google Scholar