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Structural and optical properties of CdSe, CdTe and CdSeTe nanoparticles dispersed in SiO2 films

Published online by Cambridge University Press:  01 February 2011

P. Babu Dayal ,
N. V. Rama Rao ,
B. R. Mehta ,
S. M. Shivaprasad  and
P. D. Paulson
P. Babu Dayal
Affiliation:
Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-16, India.
N. V. Rama Rao
Affiliation:
Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-16, India.
B. R. Mehta
Affiliation:
Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-16, India.
S. M. Shivaprasad
Affiliation:
Surface Physics Group, National Physical Laboratory, New Delhi-42, India.
P. D. Paulson
Affiliation:
Institute of Energy Conversion, University of Delaware, Newark, USA.
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Abstract

CdSexTe1-x nanoparticles (with different stoichiometry ratio x) dispersed in silicon dioxide films have been grown by magnetron sputtering technique followed by thermal annealing. Effect of thermal annealing conditions on the structural, compositional, optical and electronic properties of nanoparticles has been studied using GAXRD, XPS, TEM, and spectroscopic ellipsometry techniques. A structural transformation in the nanoparticle core mediated purely by surface layer effects in the case of CdTe and a spontaneous self-organization of nanoparticles into nanorods in the case of CdSe via fractal growth has been observed. Preliminary observations from the ellipsometry measurements carried out on some of these nanoparticle films shows a blue shift of absorption edge.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 789 , 2003 , N1.8
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Ijima, S. I., Nature (London) 354, 56 (1991).Google Scholar
2. Tang, Z., Kotov, N. A., Giergig, M., Science 297, 237 (2002).Google Scholar
3. Gao, X., Chan, W. C. W. and Nie, S., J. Bio-med. Optics 7, 532 (2002).Google Scholar
4. Huynh, W. H., Ditlmer, J. J. and Alivisatos, A. P., Science 295, 2425 (2002)Google Scholar
5. Nirmal, M., Norris, D., Kuno, M., Bawendi, M.G., Efros, Al. l. and Rosen, M., Phys. Rev. Lett. 75, 3728 (1995).Google Scholar
6. Mohamed, M. B., Burda, C. and Sayeed, M. A.El., Nano. Lett. 1, 589 (2001).Google Scholar
7. Link, S. and Sayeed, M.A.El., J. Appl. Phys. 92, 6799 (2002).Google Scholar
8. Li, L. S., Hu, J., Yang, N. and Alivisatos, A. P., Nano. Lett. 1, 349 (2001).Google Scholar
9. Wang, X-Y., Zhang, J-Y., Wazzal, A., Darragh, M. and Xino, M., Appl. Phys. Lett. 81 (2002) 4829.Google Scholar
10. Simmons, J. H., J. Non-cryst. Solids 239, 1 (1998) [Morey Award Paper]Google Scholar
11. Resifeld, R., J. Alloys. Comp. 341, 56 (2002)Google Scholar
12. Meldrum, Al., Haglund, R. F. Jr, Boatner, L. A. and White, C. W., Adv. Mater. 13, 1431 (2001).Google Scholar
13. Bondar, I. V. et al, Semiconductors 36, 298 (2002)Google Scholar
14. Caseri, W., Macromol. Rapid. Commun. 21, 705 (2000)Google Scholar
15. Efros, Al. L. and Rosen, M., Annu. Rev. Mater. Sci. 30, 475 (2000)Google Scholar
16. Woggon, U. in Optical properties of semiconductor quantum dots (Springer, Heidelberg, p-16, 1997)Google Scholar
17. Tsunetomo, K., Nasu, H., Katiyama, H., Kawabuchi, A, Osaka, Y., Jpn. J. Appl. Phys. 28, 1928 (1989)Google Scholar
18. Joint Committee on Powder Diffraction Standards data cards, Cubic CdTe-150770, Hexagonal CdTe-800088 and Monoclinic CdTeO3-491757.Google Scholar
19. http://hrdata.nist.gov/xps/elm_comp_res.asp Google Scholar
20. Babu Dayal, P., Mehta, B. R., Shivaprasad, S. M. and Aparna, Y., Appl. Phys. Lett. 81, 4254 (2002)Google Scholar
21. Babu Dayal, P., Mehta, B. R. and Paulson, P. D.. (Communicated to Appl. Phys. Lett)Google Scholar
22. Simmons, J. H., J. Non-cryst. Solids 239, 1 (1998) [Morey Award Paper]Google Scholar
23. Roth, L. M. and Lax, B., Phys, Rev. Lett. 3, 217 (1959)Google Scholar
24. Joint Committee on Powder Diffraction Standards data cards, Cubic CdSe:16–191, Hexagonal CdSe:77–2307 and CdSeO3-491757.Google Scholar
25. Tang, Z., Kotov, N. A., Giergig, M., Science 297, 237 (2002).Google Scholar
26. Peng, Q., Dong, Y., Deng, Z. and Li, Y., In-org. Chem. 41, 5249 (2002)Google Scholar
27. EL-Nahass, M. M., Farag, A.A. M. and El-Sayed, H.E.A., Appl. Phys. A 77, 819 (2003)Google Scholar
28. Rlide, David in Handbook of Chemistry and Physics (CRC Press, 82 nd edition, 2001–2002)Google Scholar