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Structural Properties of Pdxs/V Multilayer thin Films
Published online by Cambridge University Press: 25 February 2011
Abstract
The structures of e-beam evaporated Pd/V multilayer thin films have been studied under various film growth conditions. Both the deposition rate and the substrate temperature were varied in an e-beam source UHV deposition system, and the films were subsequently characterized by xray scattering and cross-sectional TEM.
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- Copyright © Materials Research Society 1991
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