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Structural studies of chloride-treated RF sputtered Cd1-xMnxTe films

Published online by Cambridge University Press:  01 February 2011

S. L. Wang ,
S. H. Lee ,
A. Gupta  and
A. D. Compaan
S. L. Wang
Affiliation:
Department of Physics & Astronomy, University of Toledo, Toledo, OH, 43606, USA
S. H. Lee
Affiliation:
Department of Physics & Astronomy, University of Toledo, Toledo, OH, 43606, USA
A. Gupta
Affiliation:
Department of Physics & Astronomy, University of Toledo, Toledo, OH, 43606, USA
A. D. Compaan
Affiliation:
Department of Physics & Astronomy, University of Toledo, Toledo, OH, 43606, USA
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Abstract

Cd1-xMnxTe alloy films with band gaps of 1.6 ∼ 1.8 eV have been deposited by RF magnetron sputtering for solar-cell applications. The films have been treated by chloride vapors to improve the photovoltaic performance. These as-deposited and chloride-treated CdMnTe films have been investigated by Raman spectroscopy, x-ray diffraction (XRD) and scanning electron microscopy (SEM). Raman results indicate that Te and/or TeO2 exists in the annealed samples depending on anneal conditions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 836: Symposium L – Materials for Photovoltaics , 2004 , L5.39
Copyright
Copyright © Materials Research Society 2005

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