Hostname: page-component-7479d7b7d-pfhbr Total loading time: 0 Render date: 2024-07-13T18:37:41.161Z Has data issue: false hasContentIssue false
  • English
  • Français

Study of Epitaxial Growth of Au on Ni(110) by Scanning Tunneling Microscopy

Published online by Cambridge University Press:  25 February 2011

Y. Kuk ,
P. J. Silverman  and
T. M. Buck
Y. Kuk
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave, Murray Hill, NJ 07974
P. J. Silverman
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave, Murray Hill, NJ 07974
T. M. Buck
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave, Murray Hill, NJ 07974
Get access

Abstract

The structure of the Au segregated Ni(110)-0.8%Au surface has been studied by scanning tunneling microscopy. The segregated Au layer forms a (7×4) structure with a c(2×4) subunit. At various coverages of Au overlayer, commensurate and incommensurate Au structures were observed. At a coverage of I monolayer, islands and facets assciated with incommensurate Au atoms were observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 94: Symposium D – Initial Stages of Epitaxial Growth , 1987 , 163
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Johnson, W.C. and Blakely, J.M., Interfacial Segregation, (Amer.Soc.Met., New York, 1979).Google Scholar
[2] Buck, T.M. in Chemistry and Physics of Solid Surface IV, Vanselow, R. and Howe, R. editors, (Springer-Verlag, New York, 1982), pp.435–464.Google Scholar
[3] McRae, E.G. and Malic, R.A., Surf. Sci, 177, 53(1986).CrossRefGoogle Scholar
[4] Buck, T.M., Stensgaard, I., Wheatley, G.H., and Marchut, L., Nucl. Inst. and Mech. 170, 519(1980).Google Scholar
[5] Buck, T.M. and McRae, E.G., Proceedings of 85’ ASM International Conference on Surface Modification and Coatings, Sission, R. Jr. editor, (ASM, New York, 1985), p. 337.Google Scholar
[6] Binnig, G., Rhorer, H., Gerber, Ch., and Weibel, E., Appl.Phys. Lett. 41, 178(1982); Phys. Rev. Lett. 50, 120,(1983).Google Scholar
[7] Kuk, Y. and Silverman, P.J., Appl. Phys. Lett. 48, 1597, (1986).CrossRefGoogle Scholar
[8] Kuk, Y. and Silverman, P.J., to be published (1987).Google Scholar
[9] Frank, F.C. and van der Merwe, J.H., Proc. Roy. Soc. London, ser. A198, 205,216, (1949).Google Scholar
[10] Stranski, I.N. and Krastanov, L., Acad. Wiss. Math-Nat, Ki Ilb Deut. 146, 707 (1938).Google Scholar