No CrossRef data available.
Article contents
Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy
Published online by Cambridge University Press: 10 February 2011
Abstract
Ultra-high-vacuum segregation studies on in-situ fractured Cu-Sb alloys were performed in terms of nanometer scale scanning Auger/Electron microscopy. S contamination leads to the formation of Cu2S precipitates which, upon removal due to fracture, expose pits with morphology that depends on the precipitate size and shape. Local variations of S and Sb distributions inside the pits were correlated to local surface orientations as Atomic Force Microscopy analysis revealed.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2001