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Temperature Controlled Scanning Nonlinear Dielectric Microscopy
Published online by Cambridge University Press: 01 February 2011
Abstract
Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10−7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.
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- Copyright © Materials Research Society 2004