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Tip-Sample Forces in Atomic Force Microscopy: Interplay between Theory and Experiment

Published online by Cambridge University Press:  15 May 2013

Sergey Belikov ,
John Alexander ,
Craig Wall  and
Sergei Magonov
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Craig Wall
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Sergei Magonov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
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Abstract

Several examples of Atomic Force Microscopy imaging in the oscillatory resonant and non-resonant modes are analyzed with a theoretical description of tip-sample force interactions. The problems of high-resolution imaging and compositional mapping of heterogeneous polymers are considered. The interplay with theory helps the experiment optimization and rational understanding of the image contrast.

Keywords

scanning probe microscopy (SPM)simulationpolymer
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1527: Symposium UU – Scanning Probe Microscopy―Frontiers in Nanotechnology , 2013 , mrsf12-1527-uu02-04
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Belikov, S., and Magonov, S., Amer. Control Confer. 979 (2009).Google Scholar
Belikov, S., and Magonov, S., Japan. Journ. Appl. Phys. 45, 2158 (2006).CrossRefGoogle Scholar
Belikov, S., Alexander, J., Magonov, S., and Yermolenko, I., Amer. Control Confer. 3228(2012).Google Scholar
de Pablo, P. L., Colchero, J., Gomez-Herrero, J., and Baro, A. M., Appl. Phys. Lett. 73, 3300 (1998).CrossRefGoogle Scholar
Magonov, S., Elings, V., Cleveland, J., Denley, D., and Whangbo, M.-H., Surface Science 389, 201 (1997).CrossRefGoogle Scholar
Proksch, R., and Yablon, D., App. Phys. Lett. 100, 073106 (2012).CrossRefGoogle Scholar
Basire, C., and Fretigny, C., C. R. Academie. Sci. Paris B325, 211 (1997).Google Scholar
Martinez, N. F., Patil, S., Lozano, J. R., and Garcia, R., Appl. Phys. Lett. 89, 153115 (2006).CrossRefGoogle Scholar
Magonov, S., Elings, V., and Papkov, V., Polymer 38, 297 (1997).CrossRefGoogle Scholar