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Vector E-Field Probe for Testing Industrial Applicators.

Published online by Cambridge University Press:  15 February 2011

Georges Roussy ,
Jean-Marie Thiebaut ,
Kodjo Agbossou  and
Bernard Dichtel
Georges Roussy
Affiliation:
Université de Nancy I, C.N.R.S. Laboratoire de Spectroscopie et des Techniques Microondes BP 239. 54506 Vandoeuvre les Nancy., FRANCE.
Jean-Marie Thiebaut
Affiliation:
Université de Nancy I, C.N.R.S. Laboratoire de Spectroscopie et des Techniques Microondes BP 239. 54506 Vandoeuvre les Nancy., FRANCE.
Kodjo Agbossou
Affiliation:
Université de Nancy I, C.N.R.S. Laboratoire de Spectroscopie et des Techniques Microondes BP 239. 54506 Vandoeuvre les Nancy., FRANCE.
Bernard Dichtel
Affiliation:
Université de Nancy I, C.N.R.S. Laboratoire de Spectroscopie et des Techniques Microondes BP 239. 54506 Vandoeuvre les Nancy., FRANCE.
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Abstract

Using the modulated scatterer technique allows us to measure the electromagnetic field in an applicator. The design of a new sensor modulated at 25 Hz is described. The operating conditions and the performance are presented.

The sensor can be used for measuring high microwave electric fields up to 10 kV/m in an industrial applicator supplied by any industrial magnetron.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 169
Copyright
Copyright © Materials Research Society 1994

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References

[1] Bassen, H., and Herman, W., Microwave Journal. 20, 35 (1977).Google Scholar
[2] Batchman, T. E., and Gimpelson, G., IEEE Trans on Microwave Theory and Techniques, MTT-31 9, 745. (1983).Google Scholar
[3] Bronaugh, E. L., Rose, M. L. Jr, and Rethmann, H. W.. IEEE, International Symposium on Electromagnetic Compatibility, Baltimore, MD, USA, 151. (1980).Google Scholar
[4] Hill, D., IEEE Trans, on Microwave Theory and Techniques, MTT-30, 92 (1982).Google Scholar
[5] Bolomey, J. C., L'onde Electrique (Electromagnétisme), 625, 73. (1982).Google Scholar
[6] Harrington, R. F., I.R.E Trans, on Microwave Theory and Techniques, MTT-10, 165, (1962).Google Scholar
[7] Iizuka, K., Proc. IEE, 110 1747, (1963).Google Scholar
[8] King, R. J., Microwave Journal, 8, 51, (1965).Google Scholar
[9] Hajnal, J.V., JEE Proceedings, 134, 350, (1987).Google Scholar
[10] Hygate, G. and Nye, J. F., Meas. Sci. Technol., 1, 703, (1990).Google Scholar
[11] Roussy, G., Dichtel, B. and Agbossou, K., French Patent No 91 13194 ( 25 October 1991).Google Scholar
[12] Agbossou, K., Thesis. Universite de Nancy 1. (12 may 1992)Google Scholar
[13] Harvey, A. F., Microwave Engineering. (Academic Press, London and New York, 1963).Google Scholar