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Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

Published online by Cambridge University Press:  16 April 2013

Thomas N. Blanton  and
Debasis Majumdar
Thomas N. Blanton*
Affiliation:
Eastman Kodak Company, Kodak Technology Center, Rochester, NY 14650-2106, USA
Debasis Majumdar
Affiliation:
Eastman Kodak Company, Kodak Technology Center, Rochester, NY 14650-2106, USA
*
a)Author to whom correspondence should be addressed. Electronic mail: thomas.blanton@kodak.com
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Abstract

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

Keywords

graphenegraphene oxideXRDXPSAFM
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Issue 2 , June 2013 , pp. 68 - 71
Copyright
Copyright © International Centre for Diffraction Data 2013 

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