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F-15 Novel Silicon Drift Detectors with Enhanced Reliability for Increasing Requirements of Analytical Applications

Published online by Cambridge University Press:  20 May 2016

O. Boslau ,
T. Eggert ,
J. Kemmer ,
A. Pahlke ,
S. Pahlke ,
R. Stoetter  and
F. Wiest
O. Boslau
Affiliation:
Ketek GmbH, Munich, Germany
T. Eggert
Affiliation:
Ketek GmbH, Munich, Germany
J. Kemmer
Affiliation:
Ketek GmbH, Munich, Germany
A. Pahlke
Affiliation:
Ketek GmbH, Munich, Germany
S. Pahlke
Affiliation:
Ketek GmbH, Munich, Germany
R. Stoetter
Affiliation:
Ketek GmbH, Munich, Germany
F. Wiest
Affiliation:
Ketek GmbH, Munich, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 178
Copyright
Copyright © Cambridge University Press 2007

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