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Line profile analysis at the Universities of Rennes and Birmingham: 1967 to 2000

Published online by Cambridge University Press:  01 March 2012

J. Ian Langford
J. Ian Langford
Affiliation:
Honorary Senior Research Fellow, School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom
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Abstract

From 1967 to 2000 Daniel Louër of the Department of Crystal Chemistry, University of Rennes, and J. Ian Langford of the Department of Physics, University of Birmingham, collaborated in studying structural imperfections by means of high-resolution X-ray powder diffractometry. They contributed to the theory and practice of line profile analysis and investigated the microstructure of a variety of nanocrystalline materials. Although many of the projects undertaken were part of the research programme at Rennes to investigate the mechanisms of solid-state reactions, the work is relevant in other fields of materials science.

Keywords

Powder diffractionline profile analysismicrostructurenanocrystalline materialsinstrumental line broadening
Type
Invited Articles
Information
Powder Diffraction , Volume 20 , Issue 4 , December 2005 , pp. 278 - 283
Copyright
Copyright © Cambridge University Press 2005

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References

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