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Micro X-ray fluorescence in materials characterization

Published online by Cambridge University Press:  06 March 2012

George J. Havrilla  and
Thomasin Miller
George J. Havrilla*
Affiliation:
Los Alamos National Laboratory, MS K484, Los Alamos, New Mexico 87545
Thomasin Miller
Affiliation:
Los Alamos National Laboratory, MS K484, Los Alamos, New Mexico 87545
*
a)Author to whom correspondence should be addressed; Electronic mail: havrilla@lanl.gov
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Abstract

Micro X-ray fluorescence (MXRF) offers the analyst a new approach to materials characterization. The range of applications is expanding rapidly. Single point analysis has been demonstrated for nanoliter volumes with detection limits at the 0.5 ng level. MXRF can be used as an element specific detector for capillary electrophoresis. Elemental imaging applications include analysis of sample corrosion and polymers, use as a combinatorial chemistry screening tool, and integration with molecular spectroscopic imaging methods to provide a more comprehensive characterization. Three-dimensional elemental imaging is a reality with the development of a confocal X-ray fluorescence microscope. Stereoview elemental X-ray imaging can provide unique views of materials that flat two-dimensional images cannot achieve. Spectral imaging offers chemical imaging capability, moving MXRF into a higher level of information content. The future is bright for MXRF as a materials characterization tool.

Type
Special Section on Microanalysis
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 119 - 126
Copyright
Copyright © Cambridge University Press 2004

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