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Structure Determination of Tl4V2O7 from Powder Diffraction Data using an Inel X-Ray PSD: Stereochemical Activity of Thallium(I) Lone Pair

Published online by Cambridge University Press:  10 January 2013

A. Jouanneaux
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
O. Joubert
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
M. Evain
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
M. Ganne
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France

Abstract

The crystal structure of Tl4V2O7 is solved ab-initio from powder diffraction data collected in Debye-Scherrer geometry using an Inel X-ray Position Sensitive Detector. The structure has been determined from Rietveld analysis in space group ml, Z = 1, with a = 5.9388(2)Å and c = 7.7322(3)Å. The structure of Tl4V2O7 is built up from isolated V2O7 groups aligned along the trigonal c axis. Thallium atoms alternate along a 3-fold axis. The presence of stereochemically active lone pairs is demonstrated and their positions are calculated using a self-consistent electrostatic model. The influence of sample absorption is briefly discussed and the results are compared with those obtained in Bragg-Brentano geometry using flat-plate specimen.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1992

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References

Caglioti, G., Paoletti, A. & Ricci, F.P. (1958). Nucl. Instrum., 3, 223228.CrossRefGoogle Scholar
Deniard, P., Evain, M., Barbet, J.M. & Brec, R. (1991). Materials Science Forum, 79–82, 363370.CrossRefGoogle Scholar
De Wolff, P.M. (1968). J. Appl. Crystallogr. 1, 108113.CrossRefGoogle Scholar
Evain, M., Barbet, J.M., Deniard, P. & Brec, R. (1990). Powder Diffraction Meeting, Toulouse, France.Google Scholar
Evain, M., Deniard, P., Jouanneaux, A. & Brec, R. (1992). In preparation.Google Scholar
Ganne, M. & Tournoux, M. (1971). C.R. Acad. Sc. Paris, 272, 18581860.Google Scholar
Gillespie, R.J. & Nyholm, R.S. (1957). Quart. Rev. Chem. Soc., 11, 339380.CrossRefGoogle Scholar
Hewat, A.W. (1979). Acta Crystallogr. A35, 248.CrossRefGoogle Scholar
Hill, R.J. & Fisher, R.X. (1990). J. Appl. Crystallogr. 23, 462468.CrossRefGoogle Scholar
International Tables for X-ray Crystallography”, (1974). Vol. IV, The Kynoch Press, Birmingham.Google Scholar
Jouanneaux, A., Joubert, O., Fitch, A.N. & Ganne, M. (1991). Mat. Res. Bull., 26, 973982 and references therein.CrossRefGoogle Scholar
Jouini, N. (1986). J. Solid State Chem., 63, 439445.CrossRefGoogle Scholar
Le Bail, A., Duroy, H. & Fourquet, J.L. (1988). Mat. Res. Bull., 23, 447452.CrossRefGoogle Scholar
Murray, A.D. & Fitch, A.N. (1989). MPROF, “A Multipattern Rietveld Refinement Program for Neutron, X-ray and Synchrotron radiation”.Google Scholar
Rietveld, H.M. (1969). J. Appl. Crystallogr. 2, 6571.CrossRefGoogle Scholar
Rouse, K.D. & Cooper, M.J. (1970). Acta Crystallogr. A26, 682691.CrossRefGoogle Scholar
Shanker, J. & Agarwal, S.C. (1976). Indian J. Pure Appl. Phys., 14, 7980.Google Scholar
Sheldrick, G.M. 1986. SHELXS-86, “A Program of Crystal Structure Determination”, Universität Göttingen.Google Scholar
Smith, G.S. & Snyder, R.L. (1979). J. Appl. Crystallogr. 12, 6065.CrossRefGoogle Scholar
Toraya, H. (1986). J. Appl. Crystallogr. 19, 440447.CrossRefGoogle Scholar
Touboul, M., Ganne, M., Cuche, C. & Tournoux, M. (1974). Z. anorg. allg. Chem., 410, 18.Google Scholar
Verbaere, A., Marchand, R. & Tournoux, M. (1978). J. Solid State Chem., 23, 383390.CrossRefGoogle Scholar
Werner, P.E., Eriksson, L. & Westdahl, M.J. (1985). J. Appl. Crystallogr. 18, 367370.CrossRefGoogle Scholar
Yao, T. & Jinno, H. (1982). Acta Crystallogr. A38, 287288.CrossRefGoogle Scholar
Zachariasen, W.H. (1978). J. Less-Common Met., 62, 17.CrossRefGoogle Scholar