Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-19T18:00:11.396Z Has data issue: false hasContentIssue false

Considerations in the Design of Goniometers for Use in X-Ray Powder Diffractometers

Published online by Cambridge University Press:  10 January 2013

R. Jenkins
Affiliation:
JCPDS-International Centre for Diffraction Data, Swarthmore, Pennsylvania, U.S.A.
W. N. Schreiner
Affiliation:
Philips Laboratories, North American Philips Corporation, Briarcliff Manor, New York, U.S.A.

Abstract

Most modern X-ray powder diffraction work is carried out using the parafocusing powder diffractometer. The typical instrument employs a mechanical goniometer to control the basic geometric movements required for recording diffraction data. Modern trends toward high speed data acquisition and computerized analytical procedures make the need for a well designed and well maintained goniometer system increasingly critical. This paper reviews the mechanical design parameters of typical goniometer systems in light of their influence on the accuracy and precision obtainable in diffraction data. Data on typical vertical and horizontal goniometer systems are compared, along with bench tests using a state of the art “anti-backlash” gearing system. By examining the nature of the errors typically encountered in today's goniometers it becomes evident why the next major improvement will likely be in software rather than hardware.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Jenkins, R., Adv. X-Ray Anal., (1977), 20, p. 125.Google Scholar
2.Jenkins, R. and Hubbard, C. R., Adv. X-Ray Anal., (1978), 21, p. 133.Google Scholar
3.Schreiner, W. N. and Fawcett, T., Adv. X-Ray Anal., (1985), 28, p. 309.Google Scholar
4.Parrish, W. and Wilson, A. J. C., ‘International Tables for X-Ray Crystallography’ (1959) 2, pp. 216234.Google Scholar
5.Klug, H. P. and Alexander, L. E., “X-Ray Diffraction Procedures, 2nd Ed.,” Chapter 5, John Wiley: New York, (1973).Google Scholar
6.Schreiner, W. N., Jenkins, R., Surdukowski, C. and Villamizar, C., Norelco Reporter, (1982), 29, p. 42.Google Scholar
7.Ladell, J., 'Asymmetric Texture Sensitive X-ray Powder Diffractometer. US Pat. #04199678, 4/22/80.Google Scholar
8.Holzapfel., W. B., “X-ray Diffraction Measurement Device Using White X-rays,”US Pat. #03903415, 2/9/75.Google Scholar
9.Rigaku, , ‘Microfocus X-Ray DiffractometerGoogle Scholar
10.Jenkins, R. and Squires, B., Norelco Reporter, (1982), 29, p. 20.Google Scholar
11.Jefferson, T. B. and Brooking, W. J. (1950). “Introduction to Mechanical Design”, Chapter 11. New York: Ronald Press Company.Google Scholar
12.ITW Spiroid, Illinois Tool Works Company.Google Scholar
13.Schreiner, W. N., Surdukowski, C. and Jenkins, R., J. App. Cryst., (1982) 15, p. 524.CrossRefGoogle Scholar
14.Michalec, G. W., “Precision Gearing — Theory and Practice”, John Wiley and Sons: New York (1966).Google Scholar