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Dislocations in Deformed Aluminum Alloy

Published online by Cambridge University Press:  19 May 2016

Z. Zhang  and
Y. Wang
Z. Zhang
Affiliation:
Physics Department, Jilin University, Changchun 130023, China
Y. Wang
Affiliation:
Physics Department, Jilin University, Changchun 130023, China
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Abstract

A deformed aluminum-copper alloy was studied by X-ray diffraction. The 111 diffraction profile was found to consist of a main peak and a subpeak. They were separated by a numerical differential method combined with a non-linear least square profile fitting procedure. The subpeak could not be ascribed to the θ phase in the alloy since the intensity ratio of the subpeak to main peak is 20-30 times more than the volume ratio of the θ phase to die matrix. On the other hand, the Transmission Electron Microscope (TEM) micrographs showed clearly that there is a highly inhomogeneous dislocation distribution just like the cell structure in pure aluminum. The main X-ray peak was thus assumed to be due to diffraction from the cell interior while the subpeak is determined by the cell wall. After applying a series of standard data processing procedures based on Wilkens' theory and the Pearson VII-Voigt function, the dislocation densities in both the cell interior and wall were evaluated.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 3 , September 1988 , pp. 138 - 141
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

Langford, J. I. (1978). J Appl. Crystallogr. 11, 10–14.Google Scholar
Naidu, S. V. N. & Houska, C. R. (1982). J. Appl. Crystallogr. 15, 190–198.CrossRefGoogle Scholar
Ungar, T., Mughrabi, H., Rönnpagel, , & Wilkens, M. (1984). Acta Metall. 32, 333–342.Google Scholar
Wang, Y., Lee, S. & Lee, Y. (1982). J. Appl. Crystallogr. 15, 35–38.Google Scholar
Wang, Y. & Zhang, Z. (1984). Appl. Phys. A35, 109–114.Google Scholar
Warren, B. E. & Averbach, B. L. (1950). J. Appl. Phys. 21, 595–599.Google Scholar
Warren, B. E. (1969). X-Ray Diffraction. Reading, Mass: Addison-Wesley.Google Scholar
Wilkens, M. (1970). Phys. Status Solidi (A)2, 359–370.Google Scholar