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D-20 Invited—Probing Thin-Layered and Nano-Structured Materials—X-ray Scattering Tools

Published online by Cambridge University Press:  20 May 2016

J. F. Woitok
J. F. Woitok
Affiliation:
PANalytical, Almelo, The Netherlands
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 175
Copyright
Copyright © Cambridge University Press 2008

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