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Structural and electrical properties of Nd1.7Ba0.3Ni0.9Cr0.1O4+δ compound

Published online by Cambridge University Press:  17 August 2012

Manel Jammali ,
Rached Ben Hassen  and
Jan Rohlicek
Manel Jammali
Affiliation:
Unité de Recherche de Chimie des Matériaux et de l'Environnement(UR11ES25), ISSBAT, Université de Tunis El Manar, 9, Avenue Dr. Zoheir Safi, 1006 Tunis, Tunisie
Rached Ben Hassen*
Affiliation:
Unité de Recherche de Chimie des Matériaux et de l'Environnement(UR11ES25), ISSBAT, Université de Tunis El Manar, 9, Avenue Dr. Zoheir Safi, 1006 Tunis, Tunisie
Jan Rohlicek
Affiliation:
Institute of Physics ASCR, v.v.i, Na Slovance 2, 18221 Prague 8, Czech Republic
*
a)Author to whom correspondence should be addressed. Electronic mail: rached.benhassen@fss.rnu.tn
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Abstract

The Nd1.7Ba0.3Ni0.9Cr0.1O4+δ polycrystalline sample was synthesized by the sol–gel process and a subsequent annealing at 1523 K in 1 atm of flowing argon. X-ray diffraction (XRD) analysis and electrical transport properties have been investigated as well. The oxygen non-stoichiometry was determined by iodometric titration. The sample shows adoption of the K2NiF4-type structure based on a tolerance factor calculation. Rietveld refinement of the crystal structure from X-ray powder diffraction data confirmed that Nd1.7Ba0.3Ni0.9Cr0.1O4+δ adopts the tetragonal structure (space group I4/mmm, Z = 2). The room temperature unit-cell parameters are determined to be a = 3.82515(2) and c = 12.47528(6) Å. The reliability factors are: RB = 0.043, Rwp = 0.012 and χ2 = 3.00. The Nd1.7Ba0.3Ni0.9Cr0.1O4+δ compound exhibits a semi-conductive behaviour. The electrical transport mechanism has been investigated and it agrees with the adiabatic small polaron hopping model in the temperature range 313 K ≤ T ≤ 708 K.

Keywords

X-ray diffractionK2NiF4-type structuresol–gelRietveld refinementadiabatic small polaron hopping modelsemi-conductive behaviouriodometric titration
Type
Technical Articles
Information
Powder Diffraction , Volume 27 , Issue 3 , September 2012 , pp. 184 - 188
Copyright
Copyright © International Centre for Diffraction Data 2012

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