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Structure of melt-quenched AgIn3Te5

Published online by Cambridge University Press:  05 March 2012

C. Rangasami ,
P. Malar ,
T. Osipowicz ,
Mahaveer K. Jain  and
S. Kasiviswanathan
C. Rangasami
Affiliation:
Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
P. Malar
Affiliation:
Centre for Ion Beam Applications, Department of Physics, National University of Singapore, Singapore 17542, Singapore
T. Osipowicz
Affiliation:
Centre for Ion Beam Applications, Department of Physics, National University of Singapore, Singapore 17542, Singapore
Mahaveer K. Jain
Affiliation:
Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
S. Kasiviswanathan*
Affiliation:
Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India
*
a)Author to whom correspondence should be addressed. Electronic mail: kasi@iitm.ac.in
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Abstract

Polycrystalline AgIn3Te5 synthesized by melt-quench technique has been analyzed using proton induced X-ray emission (PIXE), X-ray diffraction (XRD), and selected area electron diffraction. PIXE analysis yielded the content of Ag, In, and Te, respectively, to be 9.76%, 31.18%, and 59.05% by weight. Structure refinement was carried out considering those space groups from I- and P-type tetragonal systems which possess 4 symmetry and preserve the anion sublattice arrangement of the chalcopyrite structure (space group: I42d) as well. The results showed that AgIn3Te5 synthesized by melt-quench method crystallizes with P-type tetragonal structure (space group: P42c; unit-cell parameters a = 6.2443(8) and c = 12.5058(4) Å), the presence of which was corroborated by selected area electron diffraction studies.

Keywords

AgIn3Te5Rietveld refinementP-type tetragonalelectron diffractionPIXE
Type
Technical Articles
Information
Powder Diffraction , Volume 26 , Issue 3 , September 2011 , pp. 248 - 255
Copyright
Copyright © Cambridge University Press 2011

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