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X-ray powder diffraction analysis of a nonlinear optical material 4-chlorocinnamylidenyl-4′ -phenylacetophenone

Published online by Cambridge University Press:  10 January 2013

Zong-ming Jin ,
Jin Zheng  and
Yuan Ai-hua
Zong-ming Jin
Affiliation:
Central Laboratory, Suzhou University, 1 Shizi Street, Suzhou, 215006, People's, Republic of China
Jin Zheng
Affiliation:
Suzhou Testing Institute of Technology, 5 Minzhi Road, Suzhou, 215006, People's, Republic of China
Yuan Ai-hua
Affiliation:
Department of Basic Science, East China Shipbuilding Institute, 2 Huanchen Road, Zhenjiang, 212003, People's, Republic of China
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Abstract

A nonlinear optical material, 4-chlorocinnamylidenyl-4′ -phenylacetophenone (C23H17ClO), has been characterized by X-ray powder diffraction. Experimental values of 2θ corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 94 observed reflections with 2θ up to 60° are reported. The powder diffraction data have been evaluated, and the figures-of-merit are reported. The unit cell parameters least-squares refined from 30 nonoverlapping peaks of the orthorhombic compound with a P21212 space group are a =14.756(3) Å, b = 20.647(8) Å, c = 5.840(1) Å, V = 1779.3(9) Å3, Z = 4, and Dx = 1.287 g/cm3.

Type
Research Article
Information
Powder Diffraction , Volume 10 , Issue 4 , December 1995 , pp. 248 - 249
Copyright
Copyright © Cambridge University Press 1995

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References

Appleman, D. E., and Evans, H. T. Jr., (1973). “Indexing and Least-Squares Refinement of Powder Diffraction Data,” Rep. PB 216188, U.S. Department of Commerce, National Technical Information Service, 5286 Port Royal Rd., Springfield, VA 22151.Google Scholar
de Wolff, P. M. (1968). “A Simplified Criterion for the Reliability of a Powder Pattern Indexing,” J. Appl. Cryst. 1, 108.CrossRefGoogle Scholar
Jin, Zong-ming, Jin, Zheng, and Zhou, Xiang-yin (1994). “X-Ray Powder Diffraction Analysis of a nonlinear Optical Material 3-nitro-4-hydroxy-4′-bromobenzophenone,” Powder Diffr. 9.Google Scholar
Smith, G. S., and Snyder, R. L. (1979). “FN: A Criterion for Rating Powder Diffraction Patterns and Evaluating the Reliability of Powder Pattern Indexing,” J. Appl. Cryst. 12, 60.CrossRefGoogle Scholar
Werner, P. F. (1984). “TREOR, Trial and Error Program for Indexing of Unknown Powder Patterns,” University of Stockholm, S 106 91, Stockholm, Sweden.Google Scholar