Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-19T11:30:26.415Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic 3D modeling and simulation of nanoparticles manipulation using an AFM nanorobot

Published online by Cambridge University Press:  08 October 2013

M. H. Korayem  and
A. K. Hoshiar
M. H. Korayem*
Affiliation:
Department of Mechanical and Aerospace Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran
A. K. Hoshiar
Affiliation:
Department of Mechanical and Aerospace Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran
*
*Corresponding author. E-mail: hkorayem@iust.ac.ir
Get access Rights & Permissions [Opens in a new window]

Summary

Due to the growing use of Atomic Force Microscope (AFM) nanorobots in the moving and manipulation of cylindrical nanoparticles (carbon nanotubes and nanowires) and the fact that these processes cannot be simultaneously observed, a computer simulation of the involved forces for the purpose of predicting the outcome of the process becomes highly important. So far, no dynamic 3D model that shows changes in these forces in the course of process implementation has been presented. An algorithm is used in this paper to show in 3D, the manner by which the dynamic forces vary in the mentioned process. The presented model can simulate the forces exerted on the probe tip during the manipulation process in three directions. Because of the nonlinearity of the presented dynamic model, the effective parameters have been also studied. To evaluate the results, the parameters of the 3D case (cylindrical model) are gradually reduced and it is transformed into a 2D model (disk model); and we can observe a good agreement between the results of the two simulations. Next, the simulation results are compared with the experimental results, indicating changes in lateral force. With the help of the offered dynamic model, the cantilever deformation and the forces interacting between probe tip and particle can be determined from the moment the probe tip contacts the nanoparticle to when the nanoparticle dislodges from the substrate surface.

Keywords

AFM nanorobotNanomanipulationCylindrical nanoparticlesDynamic
Type
Articles
Information
Robotica , Volume 32 , Issue 4 , July 2014 , pp. 625 - 641
Copyright
Copyright © Cambridge University Press 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Stroscio, J. A. and Eigler, D. M., “Atomic and molecular manipulation with the scanning tunneling microscope,” Science 254 (5036), 1319–1326 (1991).CrossRefGoogle ScholarPubMed
2.Schaefer, D. M., Reifenberger, R., Patil, A. and Andres, R. P., “Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope,” Appl. Phys. Lett. 66 (8), 1012–1014 (1995).CrossRefGoogle Scholar
3.Falvo, M. R., Clary, G., Helser, A., Paulson, S., Taylor, R. M. II, Chi, V., Brooks, F. P. Jr., Washburn, S. and Superfine, R., “Nanomanipulation experiments exploring frictional and mechanical properties of carbon nanotubes,” Microsc. Microanal. 4 (5), 504–512 (1999).CrossRefGoogle Scholar
4.Falvo, M. R., Steele, J., Taylor, R. M. II and Superfine, R., “Gear like rolling motion mediated by commensurate contact: Carbon nanotubes on HOPG,” Phys. Rev. B, 62 (16), 10665–10667 (2000).CrossRefGoogle Scholar
5.Gnecco, E., Rao, A., Mougin, K., Chandrasekar, G. and Meyer, E., “Controlled manipulation of rigid nanorods by atomic force microscopy,” Nanotechnology 21 (21), 1–5 (2010).CrossRefGoogle ScholarPubMed
6.Tranvouez, E., Orieux, A., Boer-Duchemin, E., Devillers, C. H., Huc, V., Comtet, G. and Dujardin, G., “Manipulation of cadmium selenide nanorods with an atomic force microscope,” Nanotechnology 20 (16), 1–10 (2009).CrossRefGoogle ScholarPubMed
7.Guthold, M., Falvo, M. R., Matthews, W. G., Paulson, S., Washburn, S., Erie, D., Superfine, R., Brooks, F. P. and Taylor, R. M., “Controlled manipulation of molecular samples with the nanomanipulator,” IEEE-ASME Trans. Mechatronics 5 (2), 189–198 (2000).CrossRefGoogle Scholar
8.Sitti, M. and Hashimoto, H., “Controlled pushing of nanoparticles: Modeling and experiments,” IEEE-ASME Trans. Mechatronics 5 (2), 199–211 (2000).CrossRefGoogle Scholar
9.Tafazzoli, A., “Atomic Force Microscope Based Two-Dimensional Micro/Nano Particle Manipulation and Assembly,” Ph.D. thesis, Carnegie Mellon University (CMU), Pennsylvania, United States (2005) pp. 23–61.Google Scholar
10.Korayem, M. H. and Zakeri, M., “Sensitivity analysis of nanoparticles pushing critical conditions in 2D controlled nanomanipulation based on AFM,” Int. J. Adv. Manuf. Technol. 41 (7–8), 714–726 (2009).CrossRefGoogle Scholar
11.Onal, C. D., Ozcan, O. and Sitti, M., “Automated 2D nanoparticle manipulation using atomic force microscopy,” IEEE Trans. Nanotechnol. 10 (3), 472–481 (2011).CrossRefGoogle Scholar
12.Korayem, M. H., Hoshiar, A. K. and Ebrahimi, N., “Maximum allowable load of atomic force microscope (AFM) nanorobot,” Int. J. Adv. Manuf. Technol. 43 (7–8), 690–700 (2009).CrossRefGoogle Scholar
13.Daeinabi, K. and Korayem, M. H., “Nano-Manipulator Force Transducer Modeling Based on Atomic Force Microscopy,” In: Proceedings of the 9th IEEE Conference on Nanotechnology, Genoa (2009) pp. 896–899.Google Scholar
14.Daeinabi, K., Korayem, M. H. and Yarijani, S. A., “Spring constant analysis of the AFM rectangular, v-shaped and dagger cantilever probes,” Micro Nano Lett. 6 (12), 1007–1011 (2011).CrossRefGoogle Scholar
15.Lianqing, L., Peng, Y., Xiaojun, T., Yuechao, W., Zaili, D. and Ning, X., “Force Analysis of Top-Down Forming CNT Electrical Connection Using Nanomanipulation Robot,” In: Proceedings of the International Conference on Mechatronics and Automation, Luoyang, Henan (2006) pp. 113–117.Google Scholar
16.Hsu, J. H. and Chang, S. H., “Tribological Interaction Between Multi-Walled Carbon Nanotubes and Silica Surface Using Lateral Force Microscopy,” Wear 266 (9–10), 952–959 (2009).CrossRefGoogle Scholar
17.Moradi, M., Fereidon, A. H. and Sadeghzadeh, S., “Aspect ratio and dimension effects on nanorod manipulation by atomic force microscope,” Micro Nano Lett. 5 (5), 324–327 (2010).CrossRefGoogle Scholar
18.Korayem, M. H. and Hoshiar, A. K., “Modeling and simulation of dynamic modes in the manipulation of nanorods,” Micro Nano Lett. 8 (6), 284–287 (2013).CrossRefGoogle Scholar