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Characterization of electrical explosion of Schottky diode for one-shot switch applications

Published online by Cambridge University Press:  12 December 2014

Bo Hu ,
Jianshe Jiao ,
Peng Zhu ,
Lizhi Wu ,
Yinghua Ye  and
Ruiqi Shen
Bo Hu
Affiliation:
School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P.R. China
Jianshe Jiao
Affiliation:
Equipment and Technologies Research Institute of FA and ADA, Beijing 100012, P.R. China
Peng Zhu
Affiliation:
School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P.R. China
Lizhi Wu
Affiliation:
School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P.R. China
Yinghua Ye
Affiliation:
School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P.R. China
Ruiqi Shen*
Affiliation:
School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P.R. China
*
ae-mail: 719026474@qq.com
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Abstract

The electrical explosion characteristics of Schottky diode for one-shot switch applications were acquired by analysis of photographs of high speed camera and current-voltage histories. Four types of connections among Schottky diode, top electrode and discharge capacitor were studied. Results show that type B has the longest time (1.4 ms) of optical radiation and highest energy consumption, which makes it easier to turn on the switch. The charge flux of plasma was determined to be 24.5 Q/(s m2) by parallel electrode plates method. Atomic emission spectroscopic measurements were devoted to determine plasma temperature and density during electrical explosion. Results show that temperature is between 4000 K and 5000 K, and density is about 1024 m−3. The one-shot switch based on ceramics has been fabricated and characterized and the results show that the peak current and the rise time are about 963.77 A and 381.6 ns, respectively.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 68 , Issue 3 , December 2014 , 30801
Copyright
© EDP Sciences, 2014

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