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Interactive study of straight-sided buckling patterns in thin films under compressive stress

Published online by Cambridge University Press:  15 April 2000

F. Cleymand ,
C. Coupeau ,
J. Colin  and
J. Grilhe
F. Cleymand*
Affiliation:
LMP UMR 6630, SP2MI, bd Curie, Téléport 2, BP 179, 86960 Futuroscope Cedex, France
C. Coupeau
Affiliation:
LMP UMR 6630, SP2MI, bd Curie, Téléport 2, BP 179, 86960 Futuroscope Cedex, France
J. Colin
Affiliation:
LMP UMR 6630, SP2MI, bd Curie, Téléport 2, BP 179, 86960 Futuroscope Cedex, France
J. Grilhe
Affiliation:
LMP UMR 6630, SP2MI, bd Curie, Téléport 2, BP 179, 86960 Futuroscope Cedex, France
*
Cleymand@lmp.univ-poitiers.fr
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Abstract

In situ atomic force microscopy observations have been carried out of thin films under external compressive stress. Straight-sided buckling patterns arise perpendicular to the compression axis which tend to attract one another during propagation a few hundred nanometers apart. The mechanisms whereby these debonding patterns interact have been investigated taking into account the elastic energy of both the film and the substrate. The equilibrium distance between two straight-sided wrinkles has been determined; good agreement has been obtained between the experimental results and the mechanics involved.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 10 , Issue 1 , April 2000 , pp. 3 - 7
Copyright
© EDP Sciences, 2000

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