Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-21T16:19:27.042Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigating sublimation and the effect of an imaging gas in a VPSEM

Published online by Cambridge University Press:  11 June 2010

D. Waller ,
D. J. Stokes  and
A. M. Donald
D. Waller*
Affiliation:
Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge, CB3 0HE, UK
D. J. Stokes
Affiliation:
FEI Company, P.O. Box 80066, 5600 KA Eindhoven, The Netherlands
A. M. Donald
Affiliation:
Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge, CB3 0HE, UK
*
dw284@cam.ac.uk
Get access

Abstract

In this paper we present an investigation into the possible link between the pressure of the gas in the surrounding environment and the rate of ice sublimation in a VPSEM (variable pressure scanning electron microscope). Although this is mainly significant to an electron microscopist working in a variable pressure environment, it is relevant to people working at low pressures who wish to have control over the rate of sample dehydration where the input of water vapour is not a viable alternative.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 51 , Issue 1 , July 2010 , 10901
Copyright
© EDP Sciences, 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

J.I. Goldstein, H. Yakowitz, Practical Scanning Electron Microscopy, Electron and Ion Microprobe Analysis (Plenum Press, New York, 1975)
C.W. Oatley, The Scanning Electron Microscope (Cambridge University Press, 1972), Vol. 1
L. Reimer, Scanning Electron Microscope (Springer-Verlag, Berlin, 1985), Vol. 45
Cameron, R.E., Donald, A.M., J. Microsc. Oxford 193, 227 (1994) CrossRef
Callow, J.A., Osborne, M.P., Callow, M.E., Baker, F., Donald, A.M., Colloids Surf. B 27, 315 (2003) CrossRef
Danilatos, G.D., Microsc. Res. Tech. 25, 354 (1993) CrossRef
Davy, J.G., Somorjai, G.A., J. Chem. Phys. 55, 3624 (1971) CrossRef
Davy, J.G., Branton, D., Science 168, 1216 (1970) CrossRef
Fletcher, A.L., Thiel, B.L., Donald, A.M., J. Phys. D: Appl. Phys. 30, 2249 (1997) CrossRef
Waller, D., Stokes, D.J., Donald, A.M., Rev. Sci. Instrum. 79, 103709 (2008) CrossRef
Grothe, H., Waller, D., Stokes, D.J., Phys. Chem. Chem. Phys. 8, 2232 (2006) CrossRef