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Magneto-optical Faraday imaging with an apertureless scanning near field optical microscope*

Published online by Cambridge University Press:  15 March 1999

H. Wioland
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France
O. Bergossi*
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France
S. Hudlet
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France
K. Mackay
Affiliation:
Laboratoire Louis Néel (CNRS), 25 avenue des Martyrs, B.P. 166, 38042 Grenoble Cedex 9, France
P. Royer
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France
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Abstract

We have developed an apertureless Scanning Near field Optical Microscope (SNOM) in transmission, devoted to near field magneto-optics. Our apertureless SNOM combines an inverted optical microscope, which has been adapted to Faraday effect imaging, with a commercial stand-alone Scanning Probe Microscope, used in Atomic Force Microscope (AFM) mode. Two different probes are validated as apertureless SNOM tips: a home-made etched tungsten wire and a commercial AFM silicon probe. We present and analyze preliminary images of the doMayn structure in iron garnets. They indicate a SNOM resolution clearly in the sub-micrometric range. Besides, the near field magneto-optical image presents some unexpected features, not revealed in far field images.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 1999

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Footnotes

*

This paper was presented at the special CFMCP colloquium held at Strasbourg-Illkirch the July 1st-3rd, 1998.

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