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Object size effect on the contact potential difference measured by scanning Kelvin probe method

Published online by Cambridge University Press:  07 July 2010

B. Polyakov ,
R. Krutokhvostov ,
A. Kuzmin ,
E. Tamanis ,
I. Muzikante  and
I. Tale
B. Polyakov*
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
R. Krutokhvostov
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
A. Kuzmin
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
E. Tamanis
Affiliation:
G. Liberta Innovative Microscopy Center, Daugavpils University, Parades street 1, 5401 Daugavpils, Latvia
I. Muzikante
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
I. Tale
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
*
boris.polyakov@cfi.lu.lv
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Abstract

Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10–30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 μm. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 51 , Issue 2 , August 2010 , 21201
Copyright
© EDP Sciences, 2010

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References

Sebenne, C., Bolmont, D., Guichar, G., Balkanski, M., Phys. Rev. B 12, 3280 (1975) CrossRef
Rohwerder, M., Turcu, F., Electrochim. Acta 53, 290 (2007) CrossRef
Baikie, I., Mackenzie, S., Estrup, P., Meyer, J., Rev. Sci. Instrum. 62, 1326 (1991) CrossRef
Telieps, W., Bauer, E., Ultramicroscopy 17, 57 (1985) CrossRef
Jacobs, H., Stemmer, A., Surf. Interface Anal. 27, 361 (1999) 3.0.CO;2-8>CrossRef
Glatzel, T., Steigert, H., Sadewasser, S., Klenk, R., Lux-Steiner, M., Thin Solid Films 480-481, 177 (2005) CrossRef
Zhao, M., Sharma, V., Wei, H., Birge, R., Stuart, J., Papadimitrakopoulos, F., Huey, B., Nanotechnology 19, 235704 (2008) CrossRef
Jacobs, H., Leuchtmann, P., Homan, O., Stemmer, A., J. Appl. Phys. 84, 1168 (1998) CrossRef
Jacobs, H., Knapp, H., Stemmer, A., Rev. Sci. Instrum. 70, 1756 (1999) CrossRef
Tevaarwerk, E., Keppel, D., Rugheimer, P., Lagally, M., Eriksson, M., Rev. Sci. Instrum. 76, 053707 (2005) CrossRef
Zerweck, U., Loppacher, C., Otto, T., Grafström, S., Eng, L., Phys. Rev. B 71, 125424 (2005) CrossRef
Bohmisch, M., Burmeister, F., Rettenberger, A., Zimmermann, J., Boneberg, J., Leiderer, P., J. Phys. Chem. B 101, 10162 (1997) CrossRef
Nonnenmacher, M., O'Boyle, M., Wickramasinghe, H., Appl. Phys. Lett. 58, 2921 (1991) CrossRef
Glatzel, T., Sadewasser, S., Lux-Steiner, M., Appl. Surf. Sci. 210, 84 (2003) CrossRef
Sommerhalter, C., Matthes, T., Glatzel, T., Jäger-Waldau, A., Lux-Steiner, M., Appl. Phys. Lett. 75, 286 (1999) CrossRef
S. Kalinin, A. Gruverman, in Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale (Springer, 2006), p. 694
D. Lide, CRC Handbook of chemistry and physics (CRC Press, Boca Raton, 2004)
J. Riviere, M. Green, Work function: measurements and results, solid state surface science (Marcel Decker, New York, 1969)
Michaelson, H., J. Appl. Phys. 48, 4729 (1977) CrossRef
J. Hölzl, F. Schulte, Work functions of metals, in solid surface physics (Springer-Verlag, Berlin, 1979)
Kim, S., Jang, J., Chin, B., Lee, J., Curr. Appl. Phys. 8, 475 (2008) CrossRef
Kim, C., Lee, B., Yang, H., Lee, H., Lee, J., Shin, H., J. Kor. Phys. Soc. 47, S417 (2005)
Zenga, K., Zhua, F., Hua, J., Shena, L., Zhanga, K., Gongb, H., Thin Solid Films 443, 60 (2003) CrossRef
Hasnaoui, A., Politano, O., Salazar, J., Aral, G., Phys. Rev. B 73, 035427 (2006) CrossRef
Allen, G., Tucker, P., Wild, R., Oxid. Met. 13, 223 (1979) CrossRef