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Structure and morphology of nanometer-sized Pd clusters grown at high temperature on natural graphite single crystals

Published online by Cambridge University Press:  15 January 2001

C. Chapon ,
S. Granjeaud ,
A. Humbert  and
C. R. Henry
C. Chapon*
Affiliation:
CRMC2 (Laboratoire associated to the Universities of Aix-Marseille 2 and 3) -CNRS, Campus de Luminy, Case 913, 13288 Marseille Cedex 9, France
S. Granjeaud
Affiliation:
GPEC, Campus de Luminy, Case 901, 13288 Marseille Cedex 9, France
A. Humbert
Affiliation:
CRMC2 (Laboratoire associated to the Universities of Aix-Marseille 2 and 3) -CNRS, Campus de Luminy, Case 913, 13288 Marseille Cedex 9, France
C. R. Henry
Affiliation:
CRMC2 (Laboratoire associated to the Universities of Aix-Marseille 2 and 3) -CNRS, Campus de Luminy, Case 913, 13288 Marseille Cedex 9, France
*
chapon@crmc2.univ-mrs.fr
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Abstract

Performing both ex situ transmission electron microscopy (TEM) and in situ scanning tunnelling microscopy (STM) experiments on the same samples, we have characterized in detail a model catalyst (Pd/graphite). The Pd clusters were epitaxially grown at high temperature on clean natural graphite substrates under ultra high vacuum (UHV) conditions. For the chosen growth conditions the density of clusters is rather low (109 cm−2), and their size is typically few tens of nanometers. TEM diffraction studies reveal that most of the clusters (92% ) are in a same epitaxial orientation which is defined by: (1 1 1)Pd$\parallel$ (0 0 . 1)Gr and $[1 1\bar{2}]_{\rm Pd}$$\parallel$$[1 \bar{1} . 0]_{\rm Gr}$. Moreover, both STM imaging and TEM observations show that the clusters have truncated tetrahedron shapes. The combination of TEM and STM characterizations of the same samples appears to be a very efficient way to get a detailed knowledge of the global properties of a collection of supported clusters (spatial and size distributions) as well as of their individual properties (structure, morphology).

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 13 , Issue 1 , January 2001 , pp. 23 - 30
Copyright
© EDP Sciences, 2001

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