Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-26T14:05:42.402Z Has data issue: false hasContentIssue false
  • English
  • Français

Transformation of thin gold films morphology and tuning of surface plasmon resonance by post-growth thermal processing

Published online by Cambridge University Press:  28 September 2011

V.R. Romanyuk ,
O.S. Kondratenko ,
S.V. Kondratenko ,
A.V. Kotko  and
N.L. Dmitruk
V.R. Romanyuk*
Affiliation:
Institute for Physics of Semiconductors, NAS of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine
O.S. Kondratenko
Affiliation:
Institute for Physics of Semiconductors, NAS of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine
S.V. Kondratenko
Affiliation:
T. Shevchenko National University, Physics Department, prospekt Acad. Glushkova 2, Kyiv 03680, Ukraine
A.V. Kotko
Affiliation:
Institute for Physics of Semiconductors, NAS of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine
N.L. Dmitruk
Affiliation:
Institute for Physics of Semiconductors, NAS of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine
*
ae-mail: romanyuk@isp.kiev.ua
Get access

Abstract

The effect of vacuum heat treatment in the temperature range between 100 and 400 °C on the morphology and optical properties of thermally evaporated thin gold films with mass thickness from 8 to 80 nm was studied by AFM, TEM and optical spectroscopy in the spectral region of localized (surface) plasmons excitation. Our investigations have shown that change of film morphology induced by thermal annealing depends strongly on film thickness. Thus, optical behavior of thin metal films is modified due to being induced by recrystallization film permittivity changes as well as transformation of film morphology. The considered processes might be crucial for thin film optical properties determination and must be taken into account for the choice of adequate thin film optical model. Besides that, post-fabrication thermal annealing enables a wide modification of thin metal films morphology and surface plasmon resonance parameters, offering new possibilities for metal substrates design enhancing surface electromagnetic fields and therefore SERS, SEIRA, luminescence effects.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 56 , Issue 1: Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010 , October 2011 , 10302
Copyright
© EDP Sciences, 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Dmitruk, N.L., Mayeva, O.I., Sosnova, M.V., in Encyclopedia of Sensors, vol. 8, edited by Grimes, C.A., Dickey, E.C., Pishko, M.V. (American Scientific Publisher, New York, 2006), pp. 21–31Google Scholar
Homola, J., Yee, S.S., Gauglitz, G., Sens. Actuators B 54, 3 (1999)CrossRef
Huo, S.-J., Li, Q.-X., Yan, Y.-G., Chen, Y., Cai, W.-B., Xu, Q.-J., Osawa, M., J. Phys. Chem. B 109, 15985 (2005)CrossRef
Hubenthal, F., Ziegler, T., Hendrich, C., Alschinger, M., Trager, F., Eur. Phys. J. D 34, 165 (2005)CrossRef
Aspnes, D.E., Kinsbron, E., Bacon, D.D., Phys. Rev. B 21, 3290 (1980)CrossRef
Aspnes, D.E., Theeten, J.B., Hottier, F., Phys. Rev. B 20, 3292 (1979)CrossRef
Rost, M.J., Quist, D.A., Frenken, J.W.M., Phys. Rev. Lett. 91, 026101 (2003)CrossRef
Romanyuk, V.R., Kondratenko, O.S., Fursenko, O.V., Lytvyn, O.S., Zynyo, S.A., Korchovyi, A.A., Dmitruk, N.L., Mater. Sci. Eng. B 149, 285 (2008)CrossRef
Tochitskii, E.I., Crystallization and Thermal Treatment of Thin Films (Nauka and Technika, Minsk, 1976), p. 376Google Scholar
Thompson, C.V., Annu. Rev. Mater. Sci. 20, 245 (1990)CrossRef
Kennefick, C.M., Raj, R., Acta Metall. 37, 2947 (1989)CrossRef
Semin, D.J., Lo, A., Roark, S.E., Skodje, R.T., Raolen, K.L., J. Chem. Phys. 105, 5542 (1996)CrossRef
Presland, A.E.B., Price, G.L., Trimm, D.L., Surf. Sci. 29, 435 (1972)CrossRef
Kosobukin, V.A., Phys. Lett. A 160, 584 (1991)CrossRef
Ievlev, V.M., Trusov, L.I., Kholmyansky, V.A., Structural Transformations in Thin Films (Metallurgy, Moscow, 1988), p. 326Google Scholar
Dmitruk, N.L., Goncharenko, A.V., Venger, E.F., Optics of Small Particles and Composite Media (Naukova Dumka, Kyiv, 2009), p. 386Google Scholar
Bohren, C.F., Huffman, D.R., Absorption and Scattering of Light by Small Particles (John Wiley and Sons Inc., New York, 1986), p. 530 Google Scholar
Ataka, K., Heberle, J., Anal. Bioanal. Chem. 388, 47 (2007)CrossRef