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Electronic speckle pattern shearing interferometry for determining free convection heat transfer coefficient

Published online by Cambridge University Press:  15 June 1999

G. Schirripa Spagnolo*
Affiliation:
INFM – Dipartimento di Ingegneria Elettronica, Università di Roma Tre, via Della Vasca Navale 84, 00146 Roma, Italy
D. Ambrosini
Affiliation:
INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio (AQ), Italy
D. Paoletti
Affiliation:
INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio (AQ), Italy
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Abstract

An electronic speckle-pattern shearing interferometer (ESPSI) is proposed for measuring the free convection heat transfer coefficient in liquids. The heat transfer coefficient may be deduced by a simple manipulation of the speckle patterns. Theory of the method as well as its application are presented. The method is robust and easy to use for non-skilled operators.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 1999

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