4pi Analysis, Inc. (http://www.4pi.com), 67

ARC Technologies (http://www.arcnano.com), 8

Bruker AXS Microanalysis (http://www.bruker-axs.com), 65

Carl Zeiss SMT, Inc. (http://www.zeiss.com/nts), 57

Diatome (http://www.emsdiasum.com), 53

EDAX (http://www.edax.com), 49

Electron Microscope Sciences (http://www.emsdiasum.com), 62, 64, 71

Evex Analytical (http://www.evex.com), 61

FEI Company (http://www.fei.com), 4

Gatan Inc. (http://www.gatan.com), 19

Geller MicroAnalytical Lab (http://www.gellermicro.com), 47

Hitachi High Technologies America (http://www.hitachi-hhta.com), 2

International Microscopy Congress (http://www.imc17.com), 35

iXRF Systems Inc. (http://www.ixrfsystems.com), 16

JEOL USA (http://www.jeol.com), 29, 72

Lehigh Microscopy School (http://www.lehigh.edu/microscopy), 40

McCrone Group (http://www.collegeofmicroscopy.com), 14

minus k TECHNOLOGY (http://www.minusk.com), 52

Mitutoyo America Corp. (http://www.mitutoyo.com), 68

Olympus Soft Imaging Solutions (http://www.soft-imaging.net), 25

Omniprobe, Inc. (http://www.omniprobe.com), 41

Oxford Instruments (http://www.oxford-instruments.com), 9

SPI Supplies (http://www.2spi.com), 23

Ted Pella, Inc. (http://www.tedpella.com), 31, 39

Thermo Scientific (http://www.thermo.com), 7

XEI Scientific (http://evactron.com), 47