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Required Corrections for Analysis of Industrial Samples with Medical CT Scanners

Published online by Cambridge University Press:  06 March 2019

P. Engler
Affiliation:
BP America Research and Development 4440 Warrensville Center Road Cleveland, Ohio 44128
P. K. Hunt
Affiliation:
BP America Research and Development 4440 Warrensville Center Road Cleveland, Ohio 44128
E. E. Armstrong
Affiliation:
BP America Research and Development 4440 Warrensville Center Road Cleveland, Ohio 44128
W. D. Friedman
Affiliation:
BP America Research and Development 4440 Warrensville Center Road Cleveland, Ohio 44128
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Extract

As a technique for non-destructive materials analysis, computed tomography (CT) has been especially useful for studying the dependence of the structure of ceramics on manufacturing processes. CT also has been used for characterizing the lithology of reservoir cores while they are still contained in preservation material or a core barrel.

The parameter measured by CT is the X-ray attenuation coefficient, which is a function of both material density and material composition.

Type
X. X-Ray Tomography, Imaging, and Topography
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Friedman, W.D., Harris, R.D., Engler, P., Hunt, P.K. and Srinivasan, M., Characterization of Green Ceramics with X-ray Tomography and Ultrasonics, Proc. Non-Destructive Testing of Hiqh Performance Ceramics at Boston, MA, Aug. 25-27, 1987, Amer. Ceramics Soc. , ed. by Vary, A. and Snyder, J., pp. 128131.Google Scholar
2. Hunt, P.K., Engler, P. and Friedman, W.D., Industrial Applications of Xray Computed Tomograph, in: “Advances in X-ray Analysis”, vol. 31, Barrett, C.S. et al. , ed. , Plenum, New York, (1988), pp. 99105.Google Scholar
3. Wellington, S.L. and Vinegar, H.J., X-ray Computerized Tomography, J. Petroleum Tech. , August:885 (1987).Google Scholar
4. Hunt, P.K., Engler, P. and Bajsarowicz, C., Computed Tomography as a Core Analysis Tool: Instrument Evaluation, and Image Improvement Techniques, J. Petroleum Tech. , in press.Google Scholar