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High-efficiency Device for Raman Scattering Measurement of Monolayer Graphene Using Optical Fibers Within the Small Bore of a High-power Magnet

Published online by Cambridge University Press:  15 March 2016

Tadashi Mitsui
Tadashi Mitsui*
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, Sakura 3-13, Tsukuba, Ibaraki, 305-0003, JAPAN.
*
*(Email: MITSUI.Tadashi@nims.go.jp)
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Abstract

To measure the Raman scattering spectrum of a monolayer graphene sample, we describe the design and development of a high-efficiency optical measurement device for operation within the small bore of a high-power magnet at low temperature. For the high-efficiency measurement of light emitted from this small region, we designed a compact confocal optics with lens focusing and tilting systems, and used a piezodriven translation stage that allows micron-scale focus control of the sample position. In addition, we show a detailed technique of adjustment of optical axes, and explain the importance of the focusing and tilting systems. The operation of the device was confirmed by Raman scattering measurements of monolayer graphene on quartz glass with a high signal-to-noise ratio. Though the light collection efficiency of the device is about 240-fold smaller than that of a conventional optical microscope, the device has a sufficient collection efficiency for detecting the Raman scattering light of monolayer graphene.

Keywords

Raman spectroscopymagnetoopticchemical vapor deposition (CVD) (deposition)
Type
Articles
Information
MRS Advances , Volume 1 , Issue 20: Nanomaterials and Synthesis , 2016 , pp. 1435 - 1440
Copyright
Copyright © Materials Research Society 2016 

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References

REFERENCES

Novoselov, K. S. et al., Nature 438, 197 (2005).CrossRefGoogle Scholar
Geim, A. K. and Novoselov, K. S., Nature Mater. 6, 183 (2007).Google Scholar
Ferrari, A. C. et al., Phys. Rev. Lett. 97, 187401 (2006).Google Scholar
Sadowski, M. L. et al., Phys. Rev. Lett. 97, 266405 (2006).Google Scholar
Faugeras, C. et al., Phys. Rev. Lett. 103, 186803 (2009).Google Scholar
Faugeras, C. et al., Phys. Rev. Lett. 107, 036807 (2011).Google Scholar
Metzger, C. et al., Nano Lett. 10, 6 (2010).Google Scholar
Meyer, C., Sqalli, O., Lorenz, H., and Karrai, K., Rev. Sci. Instrum. 76, 063706 (2005).Google Scholar
Meyer, C., Lorenz, H., and Karrai, K., Appl. Phys. Lett. 83, 2420 (2003).Google Scholar
Mitsui, T., Rev. Sci. Instrum. 85, 113111 (2014).Google Scholar
Pohl, D. W., Rev. Sci. Instrum. 58, 54 (1987).Google Scholar