Book contents
- Frontmatter
- Contents
- Preface
- CHAPTER 1 Introduction
- CHAPTER 2 Diffraction Geometry
- CHAPTER 3 The Design of Diffractometers
- CHAPTER 4 Detectors
- CHAPTER 5 Electronic Circuits
- CHAPTER 6 The Production of the Primary Beam (X-rays)
- CHAPTER 7 The Production of the Primary Beam (Neutrons)
- CHAPTER 8 The Background
- CHAPTER 9 Systematic Errors in Measuring Relative Integrated Intensities
- CHAPTER 10 Procedure for Measuring Integrated Intensities
- CHAPTER 11 Derivation and Accuracy of Structure Factors
- CHAPTER 12 Computer Programs and On-line Control
- APPENDIX: Summary of differences between X-ray and neutron diffractometry
- References
- Index
CHAPTER 11 - Derivation and Accuracy of Structure Factors
Published online by Cambridge University Press: 21 May 2010
- Frontmatter
- Contents
- Preface
- CHAPTER 1 Introduction
- CHAPTER 2 Diffraction Geometry
- CHAPTER 3 The Design of Diffractometers
- CHAPTER 4 Detectors
- CHAPTER 5 Electronic Circuits
- CHAPTER 6 The Production of the Primary Beam (X-rays)
- CHAPTER 7 The Production of the Primary Beam (Neutrons)
- CHAPTER 8 The Background
- CHAPTER 9 Systematic Errors in Measuring Relative Integrated Intensities
- CHAPTER 10 Procedure for Measuring Integrated Intensities
- CHAPTER 11 Derivation and Accuracy of Structure Factors
- CHAPTER 12 Computer Programs and On-line Control
- APPENDIX: Summary of differences between X-ray and neutron diffractometry
- References
- Index
Summary
- Type
- Chapter
- Information
- Single Crystal Diffractometry , pp. 277 - 302Publisher: Cambridge University PressPrint publication year: 1966