Discovered just over a hundred years ago, the ubiquitous electron now forms the basis for a remarkably large range of characterization tools. Surface roughness and morphology, local atomic and electronic structure, vortex motion and superconducting properties can all be imaged thanks to the electron. Being light in mass, samples withstand appreciable irradiation without destruction. Carrying a charge, electrons can be accelerated to high energies and focussed to form transmission images or fine probes, which enables the interior of bulk samples or thin films to be investigated. Electrons may be scattered elastically to provide images of defects and interfaces at atomic resolution, or inelastically, facilitating spectroscopic studies of electronic structure in the vicinity of individual defects or interfaces. Low energy electrons, guided by a metal probe, form the basis for scanning tunneling microscopy, revealing insights into the atomic and electronic structure of surfaces.

This book presents the entire range of electron-based microscopies as applied to high Tc superconductors, scanning electron microscopy, transmission electron microscopy and scanning tunneling microscopy. Introductory chapters cover the basics of high-resolution transmission electron microscopy and microanalysis by scanning transmission electron microscopy. One chapter deals in detail with the difficult procedures of specimen preparation. Other chapters deal with imaging techniques specific to superconductors, the imaging of vortices by electron holography and the mapping of weak links by low temperature scanning electron microscopy. Several chapters deal with specific applications to subjects such as grain boundaries, thin films and device structures.