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  3. Introduction to Conventional Transmission Electron Microscopy
  • Cited by 188
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    • Publisher:
      Cambridge University Press
      Publication date:
      02 December 2009
      27 March 2003
      ISBN:
      9780511615092
      9780521629959
      DOI:
      https://doi.org/10.1017/CBO9780511615092
      Dimensions:
      Weight & Pages:
      Dimensions:
      (247 x 174 mm)
      Weight & Pages:
      1.16kg, 742 Pages
      • Subjects:
      Engineering, Materials Science
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    Subjects:
    Engineering, Materials Science
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    Book description

    This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

    Reviews

    ‘… ideal for students as well as for researchers new to the field.’

    Source: Materials World

    'The inner workings of the TEM are described comprehensively, from both a theoretical and practical point of view … engagingly written … This book aims to be a practical introduction and guide to TEM and achieves this extremely well.'

    Source: Materials World

    '… a clear and extremely well-illustrated do-it-yourself book on conventional TEM of crystals and their defects.'

    Source: Ultramicroscopy

    'The introduction to each chapter is engagingly written, generally beginning with some historic or real-world examples before getting into the mathematics behind the machine. This serves to whet the reader's appetite for more information as the chapters lead into well written mathematical theory … The book aims to be a practical introduction and guide to TEM and achieves this extremely well. Any student who reads this book from cover to cover and follows the examples given will be well on their way to performing useful TEM evaluation.'

    Source: Materials World

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