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3 - Device modeling and verification with NVNA measurements

Published online by Cambridge University Press:  05 July 2011

Patrick Roblin
Patrick Roblin
Affiliation:
Ohio State University
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Summary

Compact models of active devices that are integrated into circuit simulators are an integral part of the design process of both RF integrated circuits (RFICs) and monolithic microwave integrated circuits (MMICs). The accuracy of these device models in capturing the range of behavior of the devices is of critical importance for the successful design of first-pass RFICs and MMICs. Reliable compact device models have also come to be expected by microwave engineers for the design of RF/microwave circuits using discrete components such as power amplifiers, mixers, and oscillators.

This chapter will present some examples of the applications of NVNA measurements to both device modeling and model verification. The focus will be placed on devices for which memory effects are not dominant. The characterization and modeling of memory effects will be discussed in the next chapter.

NVNAs are primarily used for model verification, and an example will be presented. Various RF excitations can be used to test the devices in normal mode of operation, in breakdown [1] [2], or to investigate the device symmetry or lack thereof. Finally, using even more exotic modulated excitations, NVNA measurements can permit one to rapidly capture, in a single measurement, the operation of the device in a wide range of voltages for the direct extraction of nonlinear models.

Type
Chapter
Information
Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
Interactive Measurement and Design Techniques
 , pp. 66 - 88
Publisher: Cambridge University Press
Print publication year: 2011

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References

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