Nonlinear RF Circuits and Nonlinear Vector Network Analyzers Interactive Measurement and Design Techniques
Book contents
- Frontmatter
- Contents
- Preface
- Dedication
- Acknowledgments
- 1 Wireless signals
- 2 Large-signal vector measurement techniques with NVNAs
- 3 Device modeling and verification with NVNA measurements
- 4 Characterization and modeling of memory effects in RF power transistors
- 5 Interactive loadline-based design of RF power amplifiers
- 6 Behavioral modeling
- 7 Kurokawa theory of oscillator design and phase-noise theory
- 8 Design, modeling, and linearization of mixers, modulators, and demodulators
- 9 Linearization of RF power amplifiers with memory
- Index
- References
2 - Large-signal vector measurement techniques with NVNAs
Published online by Cambridge University Press: 05 July 2011
Book contents
- Frontmatter
- Contents
- Preface
- Dedication
- Acknowledgments
- 1 Wireless signals
- 2 Large-signal vector measurement techniques with NVNAs
- 3 Device modeling and verification with NVNA measurements
- 4 Characterization and modeling of memory effects in RF power transistors
- 5 Interactive loadline-based design of RF power amplifiers
- 6 Behavioral modeling
- 7 Kurokawa theory of oscillator design and phase-noise theory
- 8 Design, modeling, and linearization of mixers, modulators, and demodulators
- 9 Linearization of RF power amplifiers with memory
- Index
- References
Summary
In this chapter we shall first review the various measurement techniques which are traditionally used for the characterization of RF circuits. Next we will introduce several nonlinear vector network analyzers (NVNAs) that have been developed to characterize the nonlinear response of circuits at radio frequencies (RF). Having described the operating principle of the various NVNAs, we will then focus in the rest of this chapter on the sampler-based NVNA. In particular, its operating principle, calibration, and extension to broadband modulation and pulsed RF signals will be discussed in detail. Overall, this chapter will provide some insights into nonlinear measurement techniques, which should complement the remaining chapters concerned with platform-independent modeling, design, and linearization techniques.
Measurement of RF signals
Various kinds of equipment are used to acquire and analyze RF signals: power meters, spectrum analyzers, oscilloscopes, vector signal analyzers. Power meters are used to accurately measure the RF power. Usually they are used to characterize steady-state RF signals but some power meters have a wide input bandwidth and can provide a measurement of the instantaneous signal power for modulated RF signals within a prescribed bandwidth. The accuracy of power meters is usually traceable to world standards and such equipment can therefore be used for power calibration.
Spectrum analyzers permit the measurement of the power spectral density of RF signals versus frequency. Typically the data are acquired during a finite-duration time window and Fourier transformed to the frequency domain for a wide frequency range.
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- Information
- Nonlinear RF Circuits and Nonlinear Vector Network AnalyzersInteractive Measurement and Design Techniques, pp. 17 - 65Publisher: Cambridge University PressPrint publication year: 2011
References
[1] , , , , and , “Compensation of random and systematic timing errors in sampling oscilloscopes,” IEEE Transactions on Instrumentation and Measurements, Vol. 55, No. 6, pp. 2146–2154, Dec. 2006.Google Scholar
[2] , , , , , , , and , “A robust approach for comparison and validation of large signal measurement systems,” in 2008 IEEE MTT-S International Microwave Symposium Digest, pp. 257–260, June 2008.Google Scholar
[3] , , and , “Optimum design of very high-efficiency microwave power amplifiers based on time-domain harmonic load-pull measurements,” IEEE Transactions on Microwave Theory and Techniques, Vol. 49, No. 6, 1107–1112, June 2001.Google Scholar
[4] , , and , “Mixer-based, vector-corrected, vector signal/network analyzer offering 300 kHz–20 GHz bandwidth and traceable phase response,” in Digest, 2005 IEEE MTT-S International Microwave Symposium, CDROM, 2005.Google Scholar
[5] Network Measurement and Description Group: www.nmdg.be.
[6] Agilent Technologies: www.agilent.com.
[7] , , , and , “Accurate on wafer measurements of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device,” in 1995 IEEE MTT-S International Microwave Symposium Digest, Vol. 3, pp. 1029–1032, 1995.Google Scholar
[8] , “Large-signal network analysis,” IEEE Microwave Magazine, Vol. 6, No. 4, pp. 82–92, Dec. 2005.Google Scholar
[9] Verspect–Teyssier–DeGroote s.a.s: www.vtd-rf.com.
[10] , , , , and , “Volterra characterization and predistortion linearization of multi-carrier power amplifiers,” in 64th ARFTG Conference Digest, 2004.Google Scholar
[11] , “Calibration of a Measurement System for High Frequency Nonlinear Devices,” Doctoral Dissertation, Vrije Universiteit Brussel, 1995.
[12] “Broadband sampling oscilloscope characterization with the ‘nose-to-nose’ calibration procedure: a theoretical and practical analysis,” IEEE Transactions on Instrumentation and Measurement, Vol. 44, No. 6, pp. 991–997, Dec. 1995.Google Scholar
[13] and , “A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications,” IEEE Microwave Wireless Component Letters, Vol. 13, No. 4, pp. 152–154, 2003.Google Scholar
[14] , , , , and , “An improved coupling method for time domain load-pull measurements,” in 65th ARFTG Conference Record, pp. 57–60, June 2005.Google Scholar
[15] , “New Pulsed-IV Pulsed-RF Measurement Techniques for Characterizing Power FETs for Pulsed-RF Power Amplifier Design,” Dissertation, Doctor of Philosophy, Ohio State University, 2008.
[16] NMDG Engineering, Large-Signal Network Analyzer System Manual, 2004.
[17] , , , , , and , “A new time domain waveform measurement setup to investigate internal node voltages in MMICs,” in Microwave Technology and Technique Workshop, ESTEC, Noordwijk, 2004.Google Scholar
[19] , Presentation on the uncalibrated acquisition with an LSNA of signals with several gigahertz modulation bandwidth, Nonlinear Measurement Workshop at ARFTG 66th Conference in December 2005, Washington, DC.
[20] and , “An improved broadband conversion scheme for the large signal network analyzer,” IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 2, pp. 483–487, Feb. 2009.Google Scholar
[21] , , , , and , “On wafer LSNA measurements including dynamic-bias,” in Proceedings of the 39th European Microwave Conference, 2009.Google Scholar
[22] , , , and , “Extended NVNA bandwidth for longterm memory measurement,” in 2004 IEEE MTT-S Digest.
[23] , , , , , and , “Multiharmonic broadband measurements using a large signal network analyzer,” in 75th ARFTG Conference Digest, 2010.Google Scholar
[24] , , , , , , , and , “Time-domain calibrated measurements of wideband multisines using a large signal network analyzer,” IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 5, pp. 1180–1192, May 2008.Google Scholar
[26] Agilent Technologies, Pulsed Measurements with the Agilent 8720ES and 8753ES Network Analyzer – Product Note, 2000.
[27] Agilent Technologies, Using a Network Analyzer to Characterize High-Power Components – Application Note 1287-6, 2003.
[28] Agilent Technologies, PNA Microwave Network Analysis – Application Note 1408-11, 2004.
[29] , , , , and , “Pulsed-IV pulsed-RF measurements using a large signal network analyzer,” in 65th ARFTG Conference, June 2005.Google Scholar
[30] , , , , and , “Very small duty cycles for pulsed time domain transistor characterization,” Proceedings of the European Microwave Association, Vol. 4, No. 6, pp. 112–117, June 2008.Google Scholar
[31] , , , , and , “Large-signal time-domain characterization of microwave transistors under RF pulsed conditions,” 2nd Nonlinear Measurement Workshop, 60th ARFTG Conference in December 2002, Washington, DC.Google Scholar
[32] , , , , , and , “Pulse profiling for AlGaN/GaN HEMTs large signal characterizations,” 38th European Microwave Conference EuMC 2008, pp. 757–760, 2008.Google Scholar
[33] , , , , , , , , and , “Pulsed-IV pulsed-RF cold-FET parasitic extraction of biased AlGaN/GaN HEMTs using large signal network analyzer,” IEEE Transactions on Microwave Theory and Techniques, Vol. 58, No. 5-I, pp. 1077–1088, May 2010.Google Scholar
[34] , , , , , , “Pulsed multitone measurements for time domain load pull characterizations of power transistors,” in 73rd ARFTG Conference Digest, Boston, 2009.Google Scholar
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