Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-23T15:46:49.461Z Has data issue: false hasContentIssue false
  • English
  • Français

Automated Quantitative XRF Analysis Software in Quality Control Applications

Published online by Cambridge University Press:  06 March 2019

Anthony J. Klimasara
Anthony J. Klimasara*
Affiliation:
GTE Electrical Products Technical Assistance Laboratory Danvers, MA 01923
Get access

Abstract

A menu-driven IBM-PC/MS-DOS software system for quantitative XRF analysis was designed combining elements of pattern recognition (spectral “fingerprinting”) with mathematical correction models. The following topics are covered:

  1. - pattern recognition method; N - dimension representation

  2. - local empirical Lachance-Traill or Lucas-Tooth & Price models

  3. - EGA/VGA intelligent driver for a calibration display

  4. - dSASE III Plus “data files - accessed from dBXL/Quicksifver”, dBASE III Plus or from compiled BASIC equipped with “call subroutines”

  5. - Examples of applications (stainless steels and ceramics).

In this approach, experimental alphas are computed utilizing the closest automatically preselected standards from available data files. Alpha values generated in this fashion we term “local alphas”. An intelligent software program is employed which automatically recognizes the resolution of tiie CRT display and delivers the best possible display for the available equipment. This new design also permits the utilization of dBXL/Quicksitver, dBASE III Plus or compiled BASIC resources for additional on site system customization programming. A dBASE III Plus file format is used for XRF data storage. This permits fast data exchange with a local ASCII database and also with all popular spreadsheet formats. Additionally, there are utility subroutines available which allow direct and rapid manipuiation of dBASE III Plus files in compiled BASIC. Application of this software system and graphics to stainless steels and engineered ceramic materials are demonstrated. RIGAKU Smax/PDP-11/73 and TRACOR X-RAY SPECTRACE 5000/Compaq 386 spectrometers are used in these studies.

Type
II. Quantitative Phase Analysis by X-Ray Diffraction (XRD)
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 111 - 116
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lachance, G.R., “Introduction to Alpha Coefficients”, Corporation Scientifique Claisse, Inc., Sainte-Foy, Quebec, 1986.Google Scholar
2. Tertia, R. Claisse, F., “Principles of Quantitative X-ray Fluorescence Analysis”, Heyden & Son Ltd, 1982.Google Scholar
3. Russ, J.C., “Processing of Energy Dispersive X-ray Spectra”, Vol. 20, Advances in X-ray Analysis, Plenum Publ. Corp., NY, 1977.Google Scholar
4. Wegscheider, W., Leyden, D.E., “‘PAREDS’ - an interactive on - line system for the interpretation of EDXRF data”, Vol. 22, Advances in X-ray Analysis, Plenum Publ. Corp., NY, 1979.Google Scholar
5. Klimasara, A.J., Barry, T.L., “Automated Quantitative XRF Analysis of Soda-lime Glass Utilizing Pattern Recognition”, Vol. 30, Advances in X-ray Analysis, Plenum Publ. Corp., NY, 1987.Google Scholar
6. Klimasara, A.J., “Automated identification of Alloys Analyzed by X-ray Energy Dispersive Method”, General Etectrfc TIS#R81AEG015, February 4, 1980, GE Class 2.Google Scholar
7. Klimasara, A.J., “Computer Programming Automates Alloy Identification”, General Electric Publication: CADMAT Electronics News, Issue 6, October 1,1980, GE Class 2.Google Scholar
8. Klimasara, A.J., Kaufman, M., “Automated SEARCH/MATCH/INTERPOLATE Method for Fast Quantitative Analysis of X-ray Spectra”, General Electric TIS #R81 AEG015, February 10, 1981, GE Class 2.Google Scholar
9. Rigaku, , USA, “DATAPLEX 360 Software Manual”, April 1985.Google Scholar
10. TracorXray, Inc., “Spectrace System Software”, October 1989.Google Scholar
11. Diversified Computer Systems, Inc. “VT-220 terminal emulator'-User's manual, Colorado, 1988.Google Scholar
12. da Cruz, F., “Kermit - A File Transfer Protocol”, Digital Press, Massachusetts, 1987.Google Scholar
13. Devijver, PA, Kittler, J., “Pattern Recognition - A Statistical Approach”, Prentice-Hall International, Inc., London, 1982.Google Scholar
14. Watanabe, S., “Pattern Recognition -Human and Mechanical”, John Wiley & Sons, NY, 1985.Google Scholar
15. Wordtech Systems, Inc., “Quicksilver” - Software Manual, Ca, 1987.Google Scholar
16. Pinnacfe Publishing, Inc., “dGEV4” - Software Manual, Wa, 1990.Google Scholar
17. Wordtech Systems, inc., “dBXL” - Software Manual, Ca, 1988.Google Scholar
18. Microsoft Corporation, “QuickBasic - Version 4“- Software Manual, Wa, 1988.Google Scholar
19. A.J.S. Publishing, Inc., “dbUB” - Software Manual, Ca, 1989.Google Scholar
20. Haas, J., “Hard Disk Menu-Version IV”, MicrofoxCo., Ohio, 1991.Google Scholar
21. Bourbaki, inc., “Idirplus” - Software Manual, 1989.Google Scholar