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Concepts of Influence Coefficients in XRF Analysis and Calibration

Published online by Cambridge University Press:  06 March 2019

Richard M. Rousseau
Richard M. Rousseau*
Affiliation:
Geological Survey of Canada, 601 Booth St., Ottawa, Ont., CANADA, K1A 0E8
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Abstract

A new computer program, named CiROU, has been written to determine the chemical composition of homogeneous samples analyzed by X-ray fluorescence spectrometry (XRF). It uses the furdamental algorithm to convert measured intensities into concentrations anc to correct for matrix effects and runs on any IBM-PC/XT/AT, PS/2 or compatible corrputer.

The program is very easy to use mainly because it is a step-by-step guide to the routine process of analyzing specimens by XRF and because a user friendly interface makes up a main menu bar containing six major options, which provide several other options inside a pull-down window system.

The program is applicable to specimens of any composition with the utmost accuracy that can be obtained from the fundamental-parameters method. It’s unique calibration procedure still adds to the accuracy by eliminating the bias between theory and reality.

The program is a complete “off-line” program allowing to perform all the steps of an XRF analysis: calculation of theoretical influence coefficients, calibration, reading of measured intensities, calculation of net intensities and concentrations of unknowns, print-out of analytical reports and data transmission to or from an external computer.

Type
III. XRF Mathematical Models and Quantitation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 77 - 82
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Rousseau, R.M., Concepts of Influence Coefficients in XRF Analysis and Calibration, (Also published in the present book).Google Scholar
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7. Pella, P.A., Feng, L.Y. and Small, J.A., X-Ray Spectrometry, 14, 125, (1985).Google Scholar
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9. Thinh, T.P. and Leroux, J., X-Ray Spectrometry, 8, 85, (1979).Google Scholar