Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-25T13:05:20.161Z Has data issue: false hasContentIssue false
  • English
  • Français

Evolution of X-Ray Instrumentation & Techniques, 1970-1990

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins
Ron Jenkins*
Affiliation:
International Centre for Diffraction Date Newtown Square, PA, USA
Get access

Abstract

While both X-ray Fluorescence Analysis and X-ray Powder Diffractometry have their roots back in the earlier half of this century it wasn't until the 1960s that the two techniques became widely accepted. The growth in the application of X-ray methods for materials analysis grew rapidly between 1960 and 1970, then gained another major leap forward in the early ‘70s with the introduction of mincomputers. The introduction of Si(Li) detectors in the late’ 60s and early ‘70s added a further dimension to the available instrumentation. This paper reviews the growth in the field of X-ray materials analysis and highlights the major mile-stones in intrumentation and techniques.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 13 - 18
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] DuMond, J. And Youte, J. P. (1940), “An X-ray method of determining rate of diffusion in the solid state”, J. Appl. Phys., 11, 357–365.Google Scholar
[2] Dinklage, J. And Frericks, R. (1963), “X-ray diffraction and diffusion in metal film-layered structures”, J. Appl. Phys., 34, 2633–5.Google Scholar
[3] Urch, D. S. (1970) “Chemical bonding effects in X-ray emission spectra - a molecular orbital model”, Adv. X-ray Anal., 14, 250–267.Google Scholar
[4] Sherman, J. (1955), “Theoretical derivation of fluorescent X-ray intensities from mixtures”, Spectrochim. Act., 7, 283–306.Google Scholar
[5] Heath, R. L., (1971) “The application of high-resolution solid state detectors to X-ray spectrometry - a review”, Adv. X-ray Anal., 15, 35.Google Scholar
[6] Pell, E. M. (1960), “Ion drift in an n-p junction” J. Appl. Phys., 31, 291302.Google Scholar
[7] Lucas-Tooth, , and H. J. |and Price, B. J. (1961), “A mathematical method for investigation of interelement effects in X-ray fluorescent analysis”, Metallurgi., 54, 149–152.Google Scholar
[8] Lachance, G. R. and Traill, R. J. (1966), “A practical solution to the matrix problem in X-ray analysis”, Can. Spectrosc., 11, 43–48.Google Scholar
[9] Raspberry, S. D. and Heinrich, K. F. J. (1974), “Calibration for interelement effects in X-ray fluorescence analysis”, Anal. Chem., 46, 81–89.Google Scholar
[10] Criss, J. W. and Birks, L. S. (1968), “Calculation methods for fluorescent X-ray spectrometry – empirical coefficients vs. Fundamental parameters”, Anal. Chem., 40, 1080–6.Google Scholar
[11] de Jongh, W. K. (1973), “X-ray fluorescence analysis applying theoretical matrix corrections. Stainless steel”, X-ray Spectrom., 2, 151–158.Google Scholar
[12] Rex, R. W. (1966), “Numerical control X-ray powder diffractometer”, Adv. X-ray Ana., 10, 366–373.Google Scholar
[13] Jenkins, R., Haas, D. J. and Paolini, F. R., (1971), “A new concept in automated powder diffractometry”, Norelco Reporte., 18, 1. .Google Scholar
[14] Johnson, G. G. Jr. and V and, V. (1967), “A computerized powder diffraction identification system”, bid. Eng. Chem., 59, 18–31.Google Scholar
[15] IEEE Standard Modular Instrumentation and Digital Interface (CAMAC) IEEE- Std. 583 (1975) Inst. of Electrical and Electronic Engineers Inc., New York.Google Scholar
[16] Rucklidge, J. C. (1978), “Automatic X-ray Fluorescence using CAMAC”, X-ray Spectrom., 7, 57–62.Google Scholar
[17] Jenkins, R (1994), “Impact of the personal computer on X-ray analysis, Historical perpective 1960-1990, Adv. X-ray Anal., 37, 16.Google Scholar
[18] Hanawalt, J. D., (1983) “History of the Powder Diffraction File”, in Crystallography in North America - Apparatus & Methods, Chapter , pp. 215–219, American Crystallographic AssociationGoogle Scholar
[19] Jenkins, R. and Smith, D. K., (1987) “The Powder Diffraction File”, in Crystallographic Databases - section 3. 3, pp. 158–177, International Union of Crystallography.Google Scholar
[20] Jenkins, R., Hahm, Y. and Pearlman, S., (1979) “The APD3600, a new dimension in qualitative and quantitative phase analysis”, Norelco Reporte., 26, 1–15.Google Scholar
[21] Needham, F. L., et al, (1993) “PCPDFWIN - Search/retrieve program for the ICDD database on CD-ROM, IUCr Congress MS-18. 01. 08.Google Scholar