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Further Application of the Intermediate X-Ray Probe

Published online by Cambridge University Press:  06 March 2019

Isidore Adler ,
Joseph Axelrod  and
Jaime J. R. Branco
Isidore Adler
Affiliation:
U. S. Geological Survey, Washington, D. C.
Joseph Axelrod
Affiliation:
U. S. Geological Survey, Washington, D. C.
Jaime J. R. Branco
Affiliation:
Universidade de Minas Gerais, Beta Horizonte, Brazil
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Abstract

The electron probe is an extremely valuable tool for chemical analysis on a microscopic scale. There are many situations, however, that require analyses in the millimeter rather than micron range, where in fact, the use of the electron probe causes concern about sample homogeneity. The X-ray probe consisting of a small X-ray beam and focusing monochromator is very useful for this intermediate region. This X-ray probe is equally useful for electrically non-conducting as well as conducting specimens. Analysis need not be performed in vacuum and can be done with great rapidity.

For example by traversing a polished section of a combination of opaque minerals, it was possible to determine the distribution of copper, silver, arsenic, iron, and mercury and to show that an unidentified mineral was a copper arsenic mineral rather than an arsenoargentite as had been supposed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 167 - 173
Copyright
Copyright © International Centre for Diffraction Data 1958

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References

1 Castaing, R., “Application des sondes électroniques a une tiicthode d'analyse ponctuelle Chimique et Cristallographiques,” Ph.D. Thesis, University of Paris, 1951.Google Scholar
2 Zeitz, L. and Baez, A. V., “Microchemical analysis by emission spectrographic and. absorption methods,” in V. E. Cosslett, Arne Engstrom and H. H. Pattee, X-ray microcopy and microradiography, 1951, p. 417–434, New York, Academic Press.Google Scholar
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