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Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

N. Gurker
N. Gurker*
Affiliation:
Technical University Vienna, Argentinierstrasse 8, A-1040 Vienna, Austria
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Extract

Electron induced X-ray mapping together with modern SEM/EDX analysis systems has reached a high level of perfection due to established methods of beam deflection and focusing and today's standard in energy dispersive X-ray detection and data processing. X-ray analysis of specimens based on X-ray excitation (XRF/XRD) is routinely performed on comparatively large specimen areas without conserved spatial information. XRF-/XRD-imaging capabilities are not yet commonly available on standard spectrometers, since both suitable X-ray optical elements are missing and there is a large intensity loss due to the necessary primary beam collimation.

Type
II. XRF Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 53 - 65
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. Horowitz, P. and Howell, J.A., A Scanning X-ray microscope using Synchrotron radiation, Söience, 178: 608 (1972)Google Scholar
2. Nicols, M.C. and Ryon, R.W., An X-ray micro-fluorescence analysis System with diffraction capabilities, Adv. in X-Ray Anal., 29: 423 (1986)Google Scholar
3. Wherry, D. and Cross, B., XRF. icrobeam analysis and digital imaging combined into powerful new technique, Kevex Analyst, 12: 8 (1986)Google Scholar
4. Gurker, N., Element mapping by a scanning X-ray System, X-Ray Spectrom., 8: 149 (1979)Google Scholar
5. Gurker, N., X-ray imaging, Adv. in X∼Ray Anal., 23: 253 (1979)Google Scholar
6. Gurker, N. and Zeiner, K., Past X-ray imaging using a position sensitive proportional counter, X-Ray Spectrctn., 10: 117 (1981)Google Scholar
7. Gurker, N., X-ray mapping using a new coded irradiation technique, X-Ray Spectrom., 14: 74 (1985)Google Scholar
8. Radon, J., Berichte über die Verhandlungen der Königlich Sächsischen Gesellschaft der Wissenschaften zu Leipzig, Math.Phys.Kl., 69: 262 (1917)Google Scholar
9. Cormack, A.M., Représentation of a function by its line intégrais with some radiological applications I. J.Appl.Phys, 34: 2722 (1963), II. J.Appl.Phys., 35:2908Google Scholar
10. Hounsfield, G.N., Computerized transverse axial scanning (tomography) Part I: Description of the System, Br.J.Radiol., 46: 1016 (1973)Google Scholar
11. Herman, G.T., “Image Reconstruction from Projections”, Academie Press, New York (1980)Google Scholar
12. Simpson, R.G. and Barrett, H.H., Coded Aperture Imaging, in “imaging for Medicine” Vol.1, S.Nudelman and Patton, D.D. ed.f Plenum Press, New York (1980)Google Scholar
13. Fenimore, E.E., Cannon, T.M., van Hulsteyn, D.B. and Lee, P., Appl. Opt., 18: 945 (1979)Google Scholar
14. Fenimore, E.E. and Cannan, T.M., Coded aperture imaging with uniformly redundant arrays, Appl.Opt., 17: 337 (1978)Google Scholar
15. Ohyama, N., Honda, T. and Tsujiuchi, J., An advanced coded imaging without sidelobes, Opt.Commun.,.27: 339 (1978)Google Scholar
16. Golay, M.J., Point arrays having compact nonredundant autocorrélations, J.Opt.Soc.Am., 61: 272 (1970)Google Scholar
17. Gourlay, A.R. and Young, N.G., Coded aperture imaging: a class of flexible mask designs, Appl.Opt., 23: 4111 (1984)Google Scholar
18. Zeiner, K., Ortsauflösende Röntgendiffraktometrie, PhD. thesis, Eienna, (1981)Google Scholar