Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-23T17:59:05.825Z Has data issue: false hasContentIssue false
  • English
  • Français

Industrial Applications of X-Ray Methods for Measuring Plating Thickness

Published online by Cambridge University Press:  06 March 2019

R. H. Zimmerman
R. H. Zimmerman*
Affiliation:
AMP, Incorporated, Harrisburg, Pennsylvania
Get access

Abstract

Calibration procedures and data are presented for plating thickness measurements of gold, silver, tin, and nickel on copper, brass, and steel basis metals. Both emission and absorption techniques are described, and examples are given of measurements on thicknesses from 10 to 600 millionths of an inch. The use is shown of masking and integrating techniques for curved or unusual shapes.

For the special problem of duplex platings, which have two metals each varying in thickness, the Kα/Kβ absorption ratio and the Lα/Lβ emission ratio are compared with conventional absorption and emission techniques.

Optical and chemical determinations are shown to be less precise as well as considerably slower than X-ray measurements on the same piece. Examples are given of the use of X-ray measurements to study fundamentals of plating processes, such as barrel-plating thickness distributions and variation of thickness across a surface, as well as to study processes such as wear or porosity.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 4: Ninth Annual Conference on Applications of X-ray Analysis, August 10-12, 1960 , 1960 , pp. 335 - 350
Copyright
Copyright © International Centre for Diffraction Data 1960

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Freidman, H. and Birks, L. S., “Thickness Measurement of Thin Coatings by X-Ray Absorption,” Rev. Sci. Instruments, Vol. 17, 1946, p. 99.Google Scholar
2. Beeghley, H. F., “An X-Ray Method for Determining Tin Coating Thickness on Steel,” J. Electrochem. Soc., Vol. 97, 1950, p. 152.Google Scholar
3. Pellissier, G. E. and Wicker, E. E., “X-Ray Tin Coating Gage,” Electrical Manufacturing, Vol. 49, 1952, p. 124.Google Scholar
4. Achey, F. A. and Serfass, E. J., “Coating TMckness Measurement by Filtered X-Ray Fluorescence,” Proc. Am. Electrochem. Soc, 1956, p. 41.Google Scholar
5. Zemany, P. D. and Liebhafsky, H. A., “Plating Thickness by the Attenuation of Characteristic X-Rays,” J. Electrochem. Soc. Vol. 103, 1956, p. 157.Google Scholar
6. Sellers, W. W. Jr., and Carroll, K. G., “Gauging of Thin Nickel Coatings by X-Ray Fluorescence,” 43rd Annual Technical Proceedings of the American Electroplater Society, 1956.Google Scholar
7. Liebhafsky, H. A. and Zemany, P. D., “Film Thickness byX-Ray Emission Spectrography,” Anal. Chem., Vol. 28, 1956, p. 455.Google Scholar
8. Kriegler, R. and Schumacher, B., “Thickness Measurements on Platings by Means of an Electron Probe,” Plating, Vol. 47, 1960, p. 393.Google Scholar
9. Cook, G. B., Mellish, C. E., and Payne, J. A., “Measurements of Thin Metal Layer s - Fluorescent X-Ray Production by Radio isotope Sources,” Anal. Chem., Vol. 32, 1960, p. 590.Google Scholar
10. Wilson, G. A., “Thickness and Hardness Measurements on Gold Deposits,” Metal Finishing, Vol. 58, 1960, p. 50.Google Scholar
11. Frant, M. S., “Salt Spray Testing of Tinplated Copper; 1, Corrosion Measurement by Chemical Porosity Test,” Plating, Vol. 45, 1958, p. 157.Google Scholar
12. Heinrlch, K. F. J. and McKinley, T. D., “X-Ray Spectrometer Applied to Small Areas Using a Commercial Instrument,” Presented at the Pittsburgh Analytical and Applied Spectres copy Conference, March 2, 1960.Google Scholar