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Location of Diffractometer Profiles in X-ray Stress Analysis

Published online by Cambridge University Press:  06 March 2019

D. Kirk
Affiliation:
Larichester Polytechnic Coventry, England CV1 5FB
P. B. Caulfield
Affiliation:
Larichester Polytechnic Coventry, England CV1 5FB
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Abstract

The location of x-ray diffractometer line profiles is of fundamental importance in x-ray stress analysis. Objective estimates of the line profile position may be derived from diffractometer measurements at a number of equally-spaced points in the region of maximum intensity. These estimates are generally based upon the corresponding turning-point of a polynomial fitted to step-scanning data. Techniques are described which simplify the computation involved. A least-squares fitting of a quadratic is satisfactory for most routine applications provided that a reasonable number of points is involved. The three-point parabola method is less satisfactory. Expressions are presented, derived using the maximum-likelihood approach, for peak location and counting variance using both quadratic and cubic equations.

Type
X-Ray Diffraction Stress Analysis
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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